2014
DOI: 10.1007/s10854-014-2205-7
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Oxygen vacancy induced dielectric relaxation studies in Bi4−xLaxTi3O12 (x = 0.0, 0.3, 0.7, 1.0) ceramics

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Cited by 20 publications
(7 citation statements)
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“…It’s associated to ionic conductivity, which is caused by the loss of oxygen during high-temperature sintering. Thus, this defect plays an important role in the conductivity of LST, which causes the dielectric loss increase [19]. Between 600 and about 680 °C, tanδ slightly decreases with increasing temperature, which is due to the decreasing of the relaxation time [16,20].…”
Section: Resultsmentioning
confidence: 99%
“…It’s associated to ionic conductivity, which is caused by the loss of oxygen during high-temperature sintering. Thus, this defect plays an important role in the conductivity of LST, which causes the dielectric loss increase [19]. Between 600 and about 680 °C, tanδ slightly decreases with increasing temperature, which is due to the decreasing of the relaxation time [16,20].…”
Section: Resultsmentioning
confidence: 99%
“…3), соответственно и накоплению большего пространственного заряда. Это приведет к увеличению явления релаксации пространственного заряда Максвелла−Вагнера в системе [20]. Следовательно, одной из вероятных причин высоких значений ε ′ у образцов с большей концентрации Sm, особенно в области низких частот, является Максвелл−Вагнеровская релаксация пространственных зарядов, накапливающихся на границах зерен.…”
Section: диэлектрические свойстваunclassified
“…Formally, typical behaviors of dielectric loss (ε ‫״‬ ) and the dissipation factor for all samples are obviously illustrated in Figures (2 & 3) respectively. The noticed higher values of tan δ at the low frequency range for all samples may be due to the presence of some defects such as oxygen vacancies that plays an important role in the conductivity [23]. The alternating-current conductivity is known to be related to the dissipation factor according to the equation [24], [5] The increase in the conductivity is smaller than that of frequency, and hence tan δ decreases with increasing frequency.…”
Section: Frequency Dependences Dielectric Parametersmentioning
confidence: 99%