“…86 Oxygen transport studies have also been reported for Pt and Re protective layers, considered also as bottom gate electrodes for MOS-like devices. 87,88,89 In the case of gate dielectric layers for CMOS and memory (DRAM) devices, several (usually high-K) binary oxides such as Ta2O5, 90,91 Y2O3, 92,93 Al2O3, 91,94,95,96 HfO2, 97,98,99,100 ZrO2, 34,101,102,103 and TiO2, 104,105,106 and also perovskite materials such as SrTiO3 and (Ba,Sr)TiO3 have been investigated, 107,108 according to their electrical and/or other physical properties after/or during growth. Apart from the characterization of the grown layers, in some of these oxide studies, oxygen diffusion through the gate dielectric towards deeper layers has also been investigated.…”