Oxidation of the hexagonal Zr(Cr0.4Fe0.6)2 Laves phase

Bozzano, Patricia B.; Ramos, Cinthia Paula; Saporiti, F.; Vazquez, Pedro A. M.; Versaci, R.; Saragovi, C.

doi:10.1016/j.jnucmat.2004.04.335

Cited by 12 publications

(1 citation statement)

References 21 publications

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“…In a recent work [1], where the literature of the PhotoElectroChemical behaviour of oxidised zirconium and its alloys was described, we showed that PEC techniques allowed to effectively discriminate minor oxides in the ZrO 2 scale. In the case of Zircaloy-4, it was possible to clearly identify the presence of haematite Fe 2 O 3 , rhomboedric solid solution (Fe x Cr 1-x ) 2 O 3 , and chromia Cr 2 O 3 , phases also recently identified by Bozzano et al [2]. Taking into account the size of precipitates (0.1-1.0 µm in diameter) compared to the size of our PEC probe (0.5 µm), we used in the present study Zircaloy-4 samples thermally treated in order to enlarge the precipitates and expecting by this way to progress in the imaging of the redistribution phenomenon of iron and chromium in the zirconia matrix Experimental Oxidation procedure.…”

Section: Introductionsupporting

confidence: 62%

Imaging by Photoelectrochemical Techniques of Laves-Phases γ Zr(Fe,Cr)<sub>2 </sub> Thermally Oxidized on Zircaloy-4

Atmani

Wouters²,

Galerie

et al. 2008

MSF

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The oxidation of γ-Zr(Fe,Cr)2 intermetallic particles during the thermal exposition of Zircaloy-4 at 470°C in oxygen was investigated with PhotoElectroChemical techniques (PEC). Via the measurement of bandgap, haematite Fe2O3 (2.2 eV), rhomboedric solid solution (FexCr1-x)2O3 (2.6 eV) and chromia Cr2O3 (3.0 eV) phases were identified as components of oxidised particles. Evolution of size, lateral distribution and density of these particles was studied in function of zirconia scale thickness. During the first stage of oxidation, the density of oxidised particles increased with thickness but decreased during a second stage, highlighting in an innovative way the phenomenon of haematite and chromia dissolution in the zirconia matrix. It is concluded that PEC techniques represent a sensitive and powerful way to locally analyse the various semiconductor phases in an oxide scale at the micron scale.

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Section: Introductionsupporting

confidence: 62%