Nano Online 2016
DOI: 10.1515/nano.bjneah.6.61
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Overview of nanoscale NEXAFS performed with soft X-ray microscopes

Abstract: Today, in material science nanoscale structures are becoming more and more important. Not only for the further miniaturization of semiconductor devices like carbon nanotube based transistors, but also for newly developed efficient energy storage devices, gas sensors or catalytic systems nanoscale and functionalized materials have to be analysed. Therefore, analytical tools like near-edge X-ray absorption fine structure (NEXAFS) spectroscopy has to be applied on single nanostructures. Scanning transmission X-ra… Show more

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Cited by 5 publications
(4 citation statements)
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References 37 publications
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“…General X-Ray Microscopy Modes. Current state-of-art X-ray microscopy includes full-view transmission X-ray microscopy and scanning transmission X-ray microscopy [97,98]. The full-view transmission X-ray microscopy is similar in principle to that of optical bright-field microscopy.…”
Section: X-ray Microscopymentioning
confidence: 99%
“…General X-Ray Microscopy Modes. Current state-of-art X-ray microscopy includes full-view transmission X-ray microscopy and scanning transmission X-ray microscopy [97,98]. The full-view transmission X-ray microscopy is similar in principle to that of optical bright-field microscopy.…”
Section: X-ray Microscopymentioning
confidence: 99%
“…Some areas on mineral particles displayed the absence of C(K) signal, high absorption (probably significantly saturated), and by negative peaks at 284 and 290 eV (Figures 3b and 5b). The latter are a consequence of rapid changes in 1st and 2nd order light at these energies, due to carbon contamination of the beamline optics (Guttmann & Bittencourt, 2015; Hanhan et al, 2009). On the thinner areas of the particles, the NEXAFS signature of C could be recorded (Figures 3a,c and 4).…”
Section: Resultsmentioning
confidence: 99%
“…Thirteen different rock varnish samples from different environments and locations worldwide, containing diverse structures and compositions, were investigated (for details, see Macholdt et al, 2015Macholdt et al, , 2017a. The soft X-rays in the STXM-NEXAFS analysis generate comparatively low radiation damage, provide a high penetration depth (Guttmann and Bittencourt, 2015), and allow investigating comparatively rich spectroscopic features for a variety of elements (Hitchcock, 2015). Among the accessible elements are C, N, and O -and, thus, the composition of organic matter inside the varnish -as well as the L-shell absorption edges of high-Z elements, such as the varnish-relevant elements Mn and Fe (Cosmidis and Benzerara, 2014).…”
Section: Introductionmentioning
confidence: 99%