Reverse offset printing and microcontact printing are fascinating methods for fabricating fine patterns because both of them can attain a 1-µm/1-µm line-and-space resolution, and the resulting patterns manifest uniform layer-thicknesses irrespective of the pattern sizes. However, the printed pattern has very sharp edges; therefore, the step-coverage of subsequent overlying layers has often been a severe problem. Further, as reverse offset printing and microcontact printing use an engraved glass and a stamp, respectively, the pattern design is restricted because of bottom-contact-type defects. Thermal sintering of the printed patterns also leads to a longer processing time. To address these problems, we have developed several complementary processes. In this presentation, wet-on-wet, electrode-embedding, and push-pull processes and a newly developed high-resolution planographic method called adhesion contrast planography are discussed.