2017
DOI: 10.1016/j.microrel.2017.09.008
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Overdriving reliability of chip scale packaged LEDs: Quantitatively analyzing the impact of component

Abstract: Overdriving reliability of chip scale packaged LEDs Quantitatively analyzing the impact of component

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Cited by 2 publications
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“…Recently, Fan et al [29] investigated the curing mechanism of phosphor/silicone composites and evaluated their mechanical properties after a high moisture ageing test. Tang et al studied the reliability of the chip-scale packaged LEDs under overdriving condition [30].…”
Section: Introductionmentioning
confidence: 99%
“…Recently, Fan et al [29] investigated the curing mechanism of phosphor/silicone composites and evaluated their mechanical properties after a high moisture ageing test. Tang et al studied the reliability of the chip-scale packaged LEDs under overdriving condition [30].…”
Section: Introductionmentioning
confidence: 99%