Overcoming contrast reversals in focused probe ptychography of thick materials: an optimal pipeline for efficiently determining local atomic structure in materials science

Gao, C.; Hofer, C.; Jannis, D.; Béché, A.; Verbeeck, J.; Pennycook, Timothy J.

doi:10.48550/arxiv.2205.13308

2022

DOI: 10.48550/arxiv.2205.13308

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Overcoming contrast reversals in focused probe ptychography of thick materials: an optimal pipeline for efficiently determining local atomic structure in materials science

C. Gao¹,

C. Hofer²,

D. Jannis³

et al.

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Overcoming contrast reversals in focused probe ptychography of thick materials: an optimal pipeline for efficiently determining local atomic structure in materials science

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References 30 publications

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