Over <i>dV/dt</i> Robustness of Switching Behavior of SiC MOSFET and a Novel Main Junction Region Design

Sun, Botao; Lei, Guangyin; Zhang, Jon

doi:10.1109/ted.2024.3383424

IEEE Trans. Electron Devices

2024

DOI: 10.1109/ted.2024.3383424

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Over dV/dt Robustness of Switching Behavior of SiC MOSFET and a Novel Main Junction Region Design

Botao Sun,

Guangyin Lei,

Jon Zhang

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Over dV/dt Robustness of Switching Behavior of SiC MOSFET and a Novel Main Junction Region Design

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References 29 publications

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