Outage probability and error rates of switched diversity systems in Hoyt fading channel

Abstract

Simple closed-form expressions of outage probability and moment generating function (MGF) are found for a switch and examine combiner (SEC) operating over independent and identically distributed (IID) Hoyt fading channel. Next, using the derived MGF, symbol error probability (SEP) of different M-ary modulation schemes are calculated. In addition, an analytic framework is presented for calculation of optimum switching threshold that ensures minimum outage probability or minimum SEP. The analysis is quite general in the sense that it covers switch and stay combiner (SSC) and Rayleigh fading as special cases.

Performance study of scan-and-wait combining over Nakagami-q (Hoyt) fading channels

“…and the channel state information is assumed to be available to the receiver. The probability density function (PDF) of the instantaneous SNR γ over a single Hoytfading channel is given by [2] f…”

“…The corresponding cumulative distribution function (CDF) of the instantaneous SNR γ can be obtained by integrating (2) and is evaluated as…”

“…In order to further reduce the complexity of the SC receiver in terms of the number of channel estimates, switch combining has been proposed. Some of the switch combining receivers include switch-and-examine combining (SEC), swich-and-examine combining with postselection (SECPS) and scan-and-wait combining (SWC) [1], [2], [7]- [13].…”