2002
DOI: 10.1016/s0030-4018(02)01556-0
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Out-of-plane displacement measurement by electronic speckle pattern interferometry in presence of large in-plane displacement

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Cited by 10 publications
(3 citation statements)
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“…(9) and (10)] and we kept a zone of 608 × 480 pixels (corresponding to a typical observed size of 28 × 21 mm 2 ), which is then decomposed into 19 × 15 subimages of 32 × 32 pixels for performing the cross correlation between I av ðx; yÞ and I 0 av ðx; yÞ. We performed the computation of I av ðx; yÞ and I 0 av ðx; yÞ [Eqs.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…(9) and (10)] and we kept a zone of 608 × 480 pixels (corresponding to a typical observed size of 28 × 21 mm 2 ), which is then decomposed into 19 × 15 subimages of 32 × 32 pixels for performing the cross correlation between I av ðx; yÞ and I 0 av ðx; yÞ. We performed the computation of I av ðx; yÞ and I 0 av ðx; yÞ [Eqs.…”
Section: Methodsmentioning
confidence: 99%
“…Then a set of three phase-shifted interferograms is obtained by calculating the spatial average of the specklegrams taken between the two instants and which are digitally shifted from one another by one pixel. SPS is also used by Martínez-Celorio et al 9 to measure out-of-plane displacement in the presence of large in-plane displacement. 7 As we see, the processing is quite complex and, in addition, SPS has the limitation that speckle grains must have a lateral extension of at least 3 pixels in the direction perpendicular to the carrier fringes, which requires the use of a slit instead of a circular aperture in the imaging system.…”
Section: Introductionmentioning
confidence: 99%
“…A first idea consists in combining the speckle interferometry and the so-called "speckle photography" technique [7]. This latter is an image correlation technique.…”
Section: Introductionmentioning
confidence: 99%