Surface Microscopy With Low Energy Electrons 2014
DOI: 10.1007/978-1-4939-0935-3_8
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Other Surface Imaging Methods with Electrons

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Cited by 5 publications
(4 citation statements)
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“…In X-ray photoemission electron microscopy (X-PEEM) the samples are illuminated with intense, tunable synchrotron radiation (Bauer, 2014). The X-PEEM imaging mode allows one to perform spatially resolved X-ray absorption spectroscopy to obtain local chemical information.…”
Section: Eiger Performance Measurements With X-peemmentioning
confidence: 99%
See 1 more Smart Citation
“…In X-ray photoemission electron microscopy (X-PEEM) the samples are illuminated with intense, tunable synchrotron radiation (Bauer, 2014). The X-PEEM imaging mode allows one to perform spatially resolved X-ray absorption spectroscopy to obtain local chemical information.…”
Section: Eiger Performance Measurements With X-peemmentioning
confidence: 99%
“…Low-energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) instruments are highly versatile characterization tools that are widely used in a vast range of research fields, from nanomagnetism and surface science to catalysis and battery research (Locatelli & Bauer, 2008;Rodríguez et al, 2010;Cheng & Keavney, 2012;Karim et al, 2017;Leanza et al, 2017). LEEM/PEEM relies on directly imaging photoelectrons locally emitted from the sample surface induced by illumination with an excitation source, such as electrons, UV-light or X-rays (Kuch et al, 2001;Bauer, 2014;Anders et al, 1999;Schneider, 1999). It explores the extreme sensitivity of the photoemitted electron intensity to local variations in the workfunction of the sample surface or to the nature of the excitation source which, combined with the high spatial resolution attainable, can be used to investigate surface science phenomena in LEEM and/or the spectroscopic response of materials in PEEM in real space, down to the nanometre scale.…”
Section: Introductionmentioning
confidence: 99%
“…This instrument combines the structural information from LEEM and LEED with the chemical/magnetic sensitivity of XPEEM. 33,34 The lateral resolution was around 10 nm in LEEM mode and 30 nm in XPEEM. 35,36 The energy resolution in photoemission experiments was about 0.15 eV.…”
Section: ■ Conclusionmentioning
confidence: 99%
“…Shadow X-ray Photoemission Electron Microscopy. We employed XPEEM 62 to probe the surface chemistry and electronic structure of the samples at the nanoscale. XPEEM is strongly surfaceselective.…”
Section: Eis Measurementsmentioning
confidence: 99%