“…Low-energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) instruments are highly versatile characterization tools that are widely used in a vast range of research fields, from nanomagnetism and surface science to catalysis and battery research (Locatelli & Bauer, 2008;Rodríguez et al, 2010;Cheng & Keavney, 2012;Karim et al, 2017;Leanza et al, 2017). LEEM/PEEM relies on directly imaging photoelectrons locally emitted from the sample surface induced by illumination with an excitation source, such as electrons, UV-light or X-rays (Kuch et al, 2001;Bauer, 2014;Anders et al, 1999;Schneider, 1999). It explores the extreme sensitivity of the photoemitted electron intensity to local variations in the workfunction of the sample surface or to the nature of the excitation source which, combined with the high spatial resolution attainable, can be used to investigate surface science phenomena in LEEM and/or the spectroscopic response of materials in PEEM in real space, down to the nanometre scale.…”