2019
DOI: 10.1002/adma.201805438
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Origins of High Performance and Degradation in the Mixed Perovskite Solar Cells

Abstract: The origins of the high device performance and degradation in the air are the greatest issues for commercialization of perovskite solar cells. Here this study investigates the possible origins of the mixed perovskite cells by monitoring defect states and compositional changes of the perovskite layer over the time. The results of deep‐level transient spectroscopy analysis reveal that a newly identified defect formed by Br atoms exists at deep levels of the mixed perovskite film, and its defect state shifts when… Show more

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Cited by 45 publications
(30 citation statements)
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“…The degradation of PSCs could originate from the degradation of the perovskite material, the interfacial materials, electrodes, or a combination of all. [ 18,19 ] To get insight into these issues, it is necessary to apply different characterization techniques that provide direct or indirect information about the degradation processes in the bulk, electrodes, and interfaces of the devices.…”
Section: Introductionmentioning
confidence: 99%
“…The degradation of PSCs could originate from the degradation of the perovskite material, the interfacial materials, electrodes, or a combination of all. [ 18,19 ] To get insight into these issues, it is necessary to apply different characterization techniques that provide direct or indirect information about the degradation processes in the bulk, electrodes, and interfaces of the devices.…”
Section: Introductionmentioning
confidence: 99%
“…The peak of the trap density of the state decreased from ≈1.4 × 10 17 cm −3 eV −1 (at 0.188 eV) to ≈1.1 × 10 16 cm −3 eV −1 (at 0.383 eV), consistent with previous reports of a decline of trap states after photo-aging. [54,55] Space charge limited current (SCLC) measurement was also conducted to compare changes in electron trap densities by using electron-only type samples as shown in Figure S13, Supporting Information. [56,57] The electron trap density increased significantly in 1.3 m thin-films, whereas that of 1.1 m thin-film remained stable.…”
Section: Resultsmentioning
confidence: 99%
“…Accordingly, it is possible to find different strategies to improve the lifetime, including the encapsulation process/method, kind of perovskite (2D, 3D, Etc. ), selective charge contacts or other layers involved [29], passivation of the interfaces [30] or the grain boundaries [31]. Nevertheless, because the degradation is a complex process that depends on the structure (layers) and their interfaces, the degradation studies must be conducted in the complete device and not in isolated layers [32].…”
Section: Perovskite Degradationmentioning
confidence: 99%