Origin of the Angular Dependence of Secondary Emission of Electrons from Tungsten

Stern, Richard M.; Taub, H.

doi:10.1103/physrevlett.20.1340

Cited by 46 publications

(3 citation statements)

References 26 publications

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“…In this paper, we start by investigating the same phenomenon with a different source of electrons: inelastically scattered electrons of similar energies, which can be called Kikuchi electrons to reflect the importance of s~ubsequent to their energy loss [9]. Several other authors [10], [11], [12], [13] have also investigated Kikuchi electrons. Gomoyunova et al [10] correctly interpreted angular Kikuchi electron distributions for Mo(100) in terms of peaks due to electrons emitted preferentially along atomic chains, but…”

Section: Introductionmentioning

confidence: 99%

Forward focusing of Auger and Kikuchi electrons for surface structure determination: Ni(100) and oxidized Mg(0001)

et al. 1989

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Angular profiles of "Kikuchi" and Auger electrons were measured and interpreted for a clean Ni(100) surface and a slightly oxidized Mg(OOOI) surface. Theoretical analysis of the data using forward focusing of the medium-energy electrons (500-1500 e V) shows that both Kikuchi and Auger electrons can be well represented as s-waves emitted from atomic sites. The Auger electron data are used to analyze the structure of slightly oxidized Mg(OOOI), yielding oxygen atom positions in the octahedral interstitial sites in the first two interlayer spacings of the metal.

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Section: Introductionmentioning

confidence: 99%

Forward focusing of Auger and Kikuchi electrons for surface structure determination: Ni(100) and oxidized Mg(0001)

et al. 1989

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“…Such asymmetry was observed experimentally and analyzed by using dynamical theory with the two-beam approximation by Miyake et al 48 Similar effects were also observed in the secondary electron emission when the incident electron angle is scanned 2-dimensionally, which is known as channeling patterns. [49][50][51][52][53][54][55] In a channeling pattern, a trace of Bragg angles due to specific planes with index, (k, l, m), forms pairs of lines that are parallel to the (k, l, m) atomic planes. The pattern often shows multiple bands, instead of multiple pairs of lines, Fig.…”

Section: Electron Channeling In Bulkmentioning

confidence: 99%

Electron Standing Waves at a Surface During Reflection High Energy Electron Diffraction and Application to Structure Analysis

Yamanaka

Ino

2000

Int. J. Mod. Phys. B

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During observation of reflection high energy electron diffraction (RHEED), the interference between the incident and diffracted beams leads to the formation of surface electron standing waves. Characteristic X-ray emission is strongly excited if the atom exists in a strong wave field. Therefore, X-ray yields depends on the position of the atom and incident glancing angle (θg) of the electron beam, since the distribution of these waves changes with θg. Such anomalous intensities of X-ray emission are clearly observed under both Bragg and surface wave resonance conditions. By using these intensities, the height and adsorption site of surface adatoms can be analyzed. In this review, surface electron channeling and its application to surface structure analysis are discussed.

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“…Inelastic collisions can result in symmetrical patterns, but these usually occur at higher primary beam energies and are a result of two-step processes. 15 This work was supported by the U. S. Naval Sea Systems Command under Contract No. N00024-81-C-5301.…”

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confidence: 99%

Diffraction Patterns in the Specimen-Current Image of a Single Crystal at Low Beam Energies

1982

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With use of low-energy electrons (40-400 eV) to scan single crystals of aluminum, diffraction patterns were discovered in the specimen-current images. The patterns have the symmetry of the reciprocal lattice and appear to be related to peaks in the curves of lowenergy electron-diffraction intensity versus incident angle for a specified primary beam energy. These patterns provide a means to investigate surface phenomena.

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Origin of the Angular Dependence of Secondary Emission of Electrons from Tungsten

Cited by 46 publications

References 26 publications

Forward focusing of Auger and Kikuchi electrons for surface structure determination: Ni(100) and oxidized Mg(0001)

Forward focusing of Auger and Kikuchi electrons for surface structure determination: Ni(100) and oxidized Mg(0001)

Electron Standing Waves at a Surface During Reflection High Energy Electron Diffraction and Application to Structure Analysis

Diffraction Patterns in the Specimen-Current Image of a Single Crystal at Low Beam Energies

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