2024
DOI: 10.1039/d3ta06654a
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Origin of sputter damage during transparent conductive oxide deposition for semitransparent perovskite solar cells

Qing Yang,
Weiyuan Duan,
Alexander Eberst
et al.

Abstract: Transparent conductive oxides (TCOs) have been widely used as transparent electrodes in numerous optoelectronic devices including perovskite/silicon tandem solar cells. A significant concern regarding the application of TCOs is the...

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Cited by 4 publications
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“…As the thickness increases, the transmission and the FOM also increase up to 300 nm, and after that, the average transmission (T avg ) and FOM decrease primarily because of the reflection of the TCE layer. An increased thickness of the TCE layer provides a better FOM; however, one needs to be careful about possible sputter damage while optimizing the TCE layer on top of such a device stack . In the n-i-p structure, it is relatively forgiving due to the thicker layer of the spiro-MeOTAD HTL layer.…”
mentioning
confidence: 99%
“…As the thickness increases, the transmission and the FOM also increase up to 300 nm, and after that, the average transmission (T avg ) and FOM decrease primarily because of the reflection of the TCE layer. An increased thickness of the TCE layer provides a better FOM; however, one needs to be careful about possible sputter damage while optimizing the TCE layer on top of such a device stack . In the n-i-p structure, it is relatively forgiving due to the thicker layer of the spiro-MeOTAD HTL layer.…”
mentioning
confidence: 99%