2018
DOI: 10.1016/j.tsf.2018.05.044
|View full text |Cite
|
Sign up to set email alerts
|

Origin and compensation of deposition errors in a broadband antireflection coating prepared using quartz crystal monitoring

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2020
2020
2021
2021

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 32 publications
0
1
0
Order By: Relevance
“…In these computational experiments we started from optimum HLIS using Al2O3/TiO2 as optical materials and 5nm steps on 4J IMM solar cells for ambient glass and both spectra used in previous sections. We considered two scenarios, namely, a thickness variation suffering from a random Gaussian error with standard deviation of 20% -as reported in (Dong et al, 2018)and a more favorable situation with a 10% standard deviation. The results of such calculations are summarized in Table 1.…”
Section: Impact Of Deposition Tolerances On Arc Performancementioning
confidence: 99%
“…In these computational experiments we started from optimum HLIS using Al2O3/TiO2 as optical materials and 5nm steps on 4J IMM solar cells for ambient glass and both spectra used in previous sections. We considered two scenarios, namely, a thickness variation suffering from a random Gaussian error with standard deviation of 20% -as reported in (Dong et al, 2018)and a more favorable situation with a 10% standard deviation. The results of such calculations are summarized in Table 1.…”
Section: Impact Of Deposition Tolerances On Arc Performancementioning
confidence: 99%