Orientation effects in thick CdS films

Hussain, Sadiq

doi:10.1016/0040-6090(74)90289-2

Cited by 8 publications

(5 citation statements)

References 3 publications

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“…The (002) reflection was considerably more intense than all other reflections. Hence the c-axis is normal to the substrate surface corresponding to the (001) fibre texture, in agreement with the work of Kahle and Berger [ll], Amith [23], and Hussain [24]. All the films examined showed thc same fibre texture.…”

Section: Crystallographic Orientationsupporting

confidence: 88%

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A Morphological and Structural Study of Evaporated Cadmium Sulphide Thin Films

Ashour¹,

Gould²,

Ramadan³

1991

Phys. Stat. Sol. (a)

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The morphology of evaporated cadmium sulphide thin films is investigated using scanning electron microscopy. As‐grown films of thickness less than 30 nm exhibit protrusions which are identified with prisms developed along the c‐axis. Pinholes and cracks in the films are also observed. The structure of the deposited films is interpreted and discussed in terms of line‐profile analysis of X‐ray diffraction patterns, with a particular emphasis given to the effeets of preparation conditions on the orientation, crystallite grain size, and residual microstrain. The films are found to be of the hexagonal wurtzite structure with c‐axis of length 0.6796 nm. All the films are found to be preferentially orientated with the 〈001〉 fibre texture. The degree of preferential orientation is found to incrcase slightly with increasing film thickness, but 10 decrcase with increasing deposition rate. In general the grain size is found to increase with increasing thickness and to decrease with increasing deposition rate, while the residual microstrain shows the oppositc dependence. The optimum temperature for the substrates during deposition appears to be approximately 150°C where the grain size is a maximum and the residual microstrain a minimum.

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Section: Crystallographic Orientationsupporting

confidence: 88%

“…However. it has also been suggested [24] that the temperature of the vapour molecules is more important in influencing the orientation than their rate of arrival.…”

Section: Crystallographic Orientationmentioning

confidence: 99%

A Morphological and Structural Study of Evaporated Cadmium Sulphide Thin Films

Ashour¹,

Gould²,

Ramadan³

1991

Phys. Stat. Sol. (a)

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“…Nevertheless, the average value of the saturation magnetisation M O calculated for different strain-free films was found to be equal to 492 & 5 G, which is in good agreement with that from previous investigations (3,4, 151. In addition, the average value of the spectroscopic splitting factor (g) was found to be 2.15 -+ 0.02 for the strain-free films, which is also in good agreement with previous measurements [3,4]. A method for the calculation of M e or M O and the g-factor from FMR measurements was described elsewhere [16].…”

Section: Intrinsic Stresssupporting

confidence: 86%

Thermal and intrinsic stresses in single-crystal nickel films

Hussain

1989

J. Phys.: Condens. Matter

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The thermal and intrinsic stresses in single-crystal nickel films, in the thickness range 500-3000 AA, prepared by epitaxial growth onto the (100) cleaved surfaces of NaF, LiF, NaCl and MgO have been obtained. Calculated results from ferromagnetic resonance experiments show that the magnitudes and directions of the film stresses depend on the nature of the substrate conditions and on the sequential ordering of the deposited layers. The experimental results revealed that the thermal stresses, which are elastic and isotropic in character, are larger than the intrinsic stresses and can be of either compressive or tensile type. This type of stress disappears after the film is removed from the substrate. The present results also show that there is no single model which sufficiently accounts for the magnitudes of the intrinsic stresses in the strained films.

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“…Figure 3 It is clear that with an increase in α, the columns tilted off the substrate normal at α = 0 • tend to come towards the vapour incidence direction as indicated by the rotational arrow in figure 5(b). The change in the texture axis with the change in α has been reported on other material such as CdS [24,25].…”

Section: 12supporting

confidence: 61%

Morphology and texture evolution of nanostructured CaF₂films on amorphous substrates under oblique incidence flux

Gaire

Snow²,

Chan³

et al. 2010

Nanotechnology

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The morphology and biaxial texture of vacuum evaporated CaF(2) films on amorphous substrates as a function of vapour incident angle, substrate temperature and film thickness were investigated by scanning electron microscopy, x-ray pole figure and reflection high energy electron diffraction surface pole figure analyses. Results show that an anomalous [220] out-of-plane texture was preferred in CaF(2) films deposited on Si substrates at < 200 °C with normal vapour incidence. With an increase of the vapour incident angle, the out-of-plane orientation changed from [220] to [111] at a substrate temperature of 100 °C. In films deposited with normal vapour incidence, the out-of-plane orientation changed from [220] at 100 °C to [111] at 400 °C. In films deposited with an oblique vapour incidence at 100 °C, the texture changed from random at small thickness (5 nm) to biaxial at larger thickness (20 nm or more). Using first principles density functional theory calculation, it was shown that [220] texture formation is a consequence of energetically favourable adsorption of CaF(2) molecules onto the CaF(2)(110) facet.

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Orientation effects in thick CdS films

Cited by 8 publications

References 3 publications

A Morphological and Structural Study of Evaporated Cadmium Sulphide Thin Films

A Morphological and Structural Study of Evaporated Cadmium Sulphide Thin Films

Thermal and intrinsic stresses in single-crystal nickel films

Morphology and texture evolution of nanostructured CaF₂films on amorphous substrates under oblique incidence flux

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Orientation effects in thick CdS films

Cited by 8 publications

References 3 publications

A Morphological and Structural Study of Evaporated Cadmium Sulphide Thin Films

A Morphological and Structural Study of Evaporated Cadmium Sulphide Thin Films

Thermal and intrinsic stresses in single-crystal nickel films

Morphology and texture evolution of nanostructured CaF2films on amorphous substrates under oblique incidence flux

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Product

Resources

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Morphology and texture evolution of nanostructured CaF₂films on amorphous substrates under oblique incidence flux