Orientation and position detection of surface-mounted devices and printed circuit boards using the high-precision fuzzy Hough transform

Chung, Hong; Park, Rae-Hong

doi:10.1117/12.171898

Search citation statements

Order By: Relevance

Paper Sections

Select...

Results1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

1997

Publication Types

Select...

Article1

Relationship

Self Cite1

Independent0

Authors

Journals

Cited by 1 publication

(1 citation statement)

References 3 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Also Fig. 11 In the proposed two-stage algorithm, high precision in orientation and position is accomplished by small parameter resolution whereas reduction in computation time is achieved by small search angle range, which is possible by coarse detection of orientation in the preprocessing step. Orientation detection by the HT is equivalent to selecting a peak in the Hough array cell.…”

Section: Resultsmentioning

confidence: 99%

Two-stage high-precision visual inspection of surface mount devices

Chung

Park

1997

J. Electron. Imaging

Self Cite

View full text Add to dashboard Cite

A two-stage high-precision algorithm for detecting the orientation and position of the surface mount device (SMD) is described. In the preprocessing step, a coarse orientation of the SMD is obtained by line fitting. A high-precision fuzzy Hough transform (FHT) is applied to the corner points to estimate precisely the orientation of the device, with its position determined by using four detected corner points. The FHT employed has a real-valued accumulator over the limited range of angles that is determined in the preprocessing step. Computer simulation with a number of test images shows that the parameters obtained by the presented algorithm are more accurate than those by conventional methods such as the moment method, projection method, and Hough transform methods. It can be applied to fast and accurate automatic inspection and placement systems. © 1997 SPIE and IS&T.

show abstract

Section: Resultsmentioning

confidence: 99%