SignificanceRapid, accurate, and nondestructive mapping of material properties is of great interest in many fields, with applications ranging from detection of defects or other subsurface features in semiconductors to estimating temperature rise in various tissue layers during laser therapy. We demonstrate the speed and precision of two interferometric techniques, quantitative phase imaging and phase-resolved optical coherence tomography, in recording optical phase changes induced by energy deposition in various materials. Such phase perturbations can be used to infer sample properties, ranging from absorption and temperature maps to distribution of electric field or resistivity. We derive the theoretical sensitivity limits of such techniques and demonstrate their applicability to the mapping of absorption coefficients, temperature, and electric fields in synthetic and biological samples.