Superlattices and Microstructures volume 39, issue 1-4, P376-380 2006 DOI: 10.1016/j.spmi.2005.08.062 View full text
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M. Kunst, T. Moehl, F. Wünsch, H. Tributsch

Abstract: Transparent, conductive SnO 2 (FTO) films and colloidal TiO 2 films deposited on these FTO films are investigated by means of contactless transient photoconductance measurements in the microwave frequency range (TRMC measurements). For the bare FTO-glass films excitation with 355 nm light pulses leads to appreciable TRMC signals indicating the semiconductor properties of the material. For TiO 2 films on FTO-glass films, injection of excess electrons from TiO 2 into FTO is observed.