2021
DOI: 10.1002/pssr.202100042
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Optoelectronic Inactivity of Dislocations in Cu(In,Ga)Se2 Thin Films

Abstract: High-efficiency Cu(In,Ga)Se 2 (CIGS) thin-film solar cells are based on polycrystalline CIGS absorber layers, which contain grain boundaries, stacking faults, and dislocations. While planar defects in CIGS layers have been investigated extensively, little is still known about the impact of dislocations on optoelectronic properties of CIGS absorbers. Herein, evidence for an optoelectronic inactivity of dislocations in these thin films is given, in contrast to the situation at grain boundaries. This unique behav… Show more

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Cited by 3 publications
(3 citation statements)
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“…Indeed, in CAPD, the S anionic sublattice stays relatively unaffected, and anion‐to‐cation ordering is satisfied. CAPD has been experimentally observed in epitaxial Cu(In,Ga)Se 2 , MgFe 2 O 4 , and SrTiO 3 :Sn grown on GaAs, [ 17,18 ] MgO(001), [ 25 ] and SrTiO 3 respectively, and in other types of materials like MgAl 2 O 4 and BeAl 2 O 4 . [ 26 ]…”
Section: Resultsmentioning
confidence: 99%
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“…Indeed, in CAPD, the S anionic sublattice stays relatively unaffected, and anion‐to‐cation ordering is satisfied. CAPD has been experimentally observed in epitaxial Cu(In,Ga)Se 2 , MgFe 2 O 4 , and SrTiO 3 :Sn grown on GaAs, [ 17,18 ] MgO(001), [ 25 ] and SrTiO 3 respectively, and in other types of materials like MgAl 2 O 4 and BeAl 2 O 4 . [ 26 ]…”
Section: Resultsmentioning
confidence: 99%
“…Indeed, in CAPD, the S anionic sublattice stays relatively unaffected, and anion-to-cation ordering is satisfied. CAPD has been experimentally observed in epitaxial Cu(In,Ga)Se 2 , MgFe 2 O 4 , and SrTiO 3 :Sn grown on GaAs, [17,18] MgO(001), [25] and SrTiO 3 respectively, and in other types of materials like MgAl 2 O 4 and BeAl 2 O 4 . [26] In the following sections, we first focus on the Cu-poor epi-CIGS sample, to introduce the concepts associated with CAPD and to describe two kinds of crystallographic defects.…”
Section: High-resolution Imaging Of the Cigs/gap Interfacementioning
confidence: 97%
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