A m ethod is d erno nst rated fo r ut ili~in g in Fabry-P erot in tC I·fero ln et r. ,· t he data o n r efl ectio n p hase shif t d isper sion obtain ed from f rin ges of eq ual chromati c o rd er . U nkn o wn wavc lengths ca n be ca lculated from t h e F ab r y-Per ot patte rn s obtain ed w i t h a la rge et>, lo n spacing, even w i t ho ut pri o r kn ow led ge o f t he ph ase shift of th e r efl ectill 'i surfaces. ' Vh en t he t heo r eti ca l ph ase shift as a fun ct i on of wave length is kn ow n approx ilY'.ately, t hen t he co rrect ord er s of in terfer ence ca n be determin ed fo r both t he Fabry -P ero t frin ges 2:1d frin ges of eq ual chro mati c o rd er. F r om t he wavelengths of t h e latter t he p hase sh if t dispersio n ca n b e m eas u red t o a n accuracy of ab ou t J 0 A. Th e rr>.e t hod is es pec ially useful f or refl ecto rs w i t h la rge dispersio n of p hase shift, such as multi laye rs. R es u l t s in t he v isi b le sp ect r um ar e r epor ted f or al uminum film s and a pair of diel ectri c 15-laye r broadband refl ecto rs.