Optimizing the position resolution of a Z-stack microchannel plate resistive anode detector for low intensity signals

Abstract

A method for achieving good position resolution of low-intensity electron signals using a microchannel plate resistive anode detector is demonstrated. Electron events at a rate of 7 counts s(-1) are detected using a Z-stack microchannel plate. The dependence of position resolution on both the distance and the potential difference between the microchannel plate and resistive anode is investigated. Using standard commercial electronics, a measured position resolution of 170 μm (FWHM) is obtained, which corresponds to an intrinsic resolution of 157 μm (FWHM).

Using pulse shape analysis to improve the position resolution of a resistive anode microchannel plate detector

“…Averaging the measured resolution of the central eight slits for either the trapezoidal or gaussian filters, one obtains an average measured resolution of 92 µm. Accounting for the finite slit width of 100 µm this measured resolution corresponds to an intrinsic resolution of 64 µm [17]. This result is competitive with the resolution obtained using more complex MCP arrangements and a retarding potential [11,12,13].…”

“…Although the resolution obtained with the analog electronics is ≈20 µm lower than that obtained with the trapezoidal filter it is not a dramatic reduction. Moreover, using the analog electronics a reasonable resolution could only be obtained for the four central slits [17]. In contrast, using the digital signal processing approach a relatively uniform resolution is obtained across the entire detector.…”

Development of a compact E×B microchannel plate detector for beam imaging

“…The significantly larger spatial resolution of 520 µm obtained with the ExB detector as compared to the 94 µm [24] associated with the simple electrostatic arrangement [6,9] indicates that the electron transport from the foil to the MCP dictates the measured resolution. To understand the electron transport in the crossed electric and magnetic fields between the secondary-emission foil and the front surface of the MCP detector we simulated the electron trajectories using the ion trajectory code SIMION [22].…”

“…The position of the incident particle is measured by constructing the time difference of the signal arrival at each end of the delay line. In prior work we used a multi-strip anode coupled to a delay line with a simple electrostatic arrangement [6,9] to achieve a spatial resolution of 94µm FWHM [24]. Any variation in the electron transport can only adversely impact this resolution.…”

“…There are several methods for providing position sensitivity with an MCP detector including: multi-strip anode [2], helical delay line [3,4], cross-strip anode [5], induced signal [6,7], resistive anode [8,9,10], and Timepix CMOS readout [11]. To realize a beam imaging detector requires transport of electrons produced at a secondary-emission foil onto the surface of the position sensitive MCP detector situated away from the beam axis.…”