Optimizing Gate Insulator Conditions via Interfacial Oxidation in Vertical Structure TFTs

Hwang, Sang Hun; Hwang, Byung Seol; Hwang, Sang Ho; Moon, Seung Jae; Lee, Jong Mo; Bae, Byung Seong

doi:10.1109/iceic61013.2024.10457204

2024 International Conference on Electronics, Information, and Communication (ICEIC) 2024

DOI: 10.1109/iceic61013.2024.10457204

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Optimizing Gate Insulator Conditions via Interfacial Oxidation in Vertical Structure TFTs

Sang Hun Hwang,

Byung Seol Hwang,

Sang Ho Hwang

et al.

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Optimizing Gate Insulator Conditions via Interfacial Oxidation in Vertical Structure TFTs

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