Automated Methods in Cryptographic Fault Analysis 2019
DOI: 10.1007/978-3-030-11333-9_13
|View full text |Cite
|
Sign up to set email alerts
|

Optimizing Electromagnetic Fault Injection with Genetic Algorithms

Abstract: Article 25fa pilot End User AgreementThis publication is distributed under the terms of Article 25fa of the Dutch Copyright Act (Auteurswet) with explicit consent by the author. Dutch law entitles the maker of a short scientific work funded either wholly or partially by Dutch public funds to make that work publicly available for no consideration following a reasonable period of time after the work was first published, provided that clear reference is made to the source of the first publication of the work.This… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
7
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
3
2
2

Relationship

0
7

Authors

Journals

citations
Cited by 12 publications
(7 citation statements)
references
References 20 publications
0
7
0
Order By: Relevance
“…They address the problem of identifying the subspace of the duration and intensity values of pulses that could produce an actual fault with a two-step process, that is, trying to optimize the parameters separately. Maldini et al [14] bring this work to EMFI through an evolutionary algorithm that tries to find the optimal geometric and pulse intensity values that maximize fault occurrence ratio while keeping some of the configuration fixed (pulse duration). Madau et al [13] offer an alternative methodology to locate the best areas to obtain unexpected behaviors on the surface of the chip; Each surface point, starting from a predefined grid, is rated using a susceptibility criterion that requires measuring electromagnetic emissions.…”
Section: Existing Methodologiesmentioning
confidence: 99%
“…They address the problem of identifying the subspace of the duration and intensity values of pulses that could produce an actual fault with a two-step process, that is, trying to optimize the parameters separately. Maldini et al [14] bring this work to EMFI through an evolutionary algorithm that tries to find the optimal geometric and pulse intensity values that maximize fault occurrence ratio while keeping some of the configuration fixed (pulse duration). Madau et al [13] offer an alternative methodology to locate the best areas to obtain unexpected behaviors on the surface of the chip; Each surface point, starting from a predefined grid, is rated using a susceptibility criterion that requires measuring electromagnetic emissions.…”
Section: Existing Methodologiesmentioning
confidence: 99%
“…Both SEInjector and DriveFI rely on domain knowledge about the SUT to prune the fault space. Maldini et al [8] propose an evolutionary algorithm for optimizing the search in the fault space and use the algorithm to attack a cryptography algorithm. The proposed algorithm relies less on prior knowledge and is more suitable for blackbox testing scenarios.…”
Section: Related Workmentioning
confidence: 99%
“…This model represents the knowledge learned automatically through interaction with the SUT, and helps us locate more critical faults with less effort. Note that, effective exploration of the fault space has also been studied in the past using other techniques such as those that are deterministic [5], [6] or model-based [7], as well as those that are based on evolutionary optimization [8] or reinforcement learning [9].…”
Section: Introductionmentioning
confidence: 99%
“…On the other hand, Carpi et al [11], Wu et al [12] and Maldini et al [13] propose fault injection settings search strategies respectively for Voltage Fault Injection (VFI), LFI and ElectroMagnetic Fault Injection (EMFI). Using Genetic Algorithms or Deep Learning, they find the most efficient fault injection settings, such as injection delays and other parameters specific to the fault injection technique, to speed up the fault exploitation.…”
Section: E Related Workmentioning
confidence: 99%