Optimized two-stage time-truncated control chart for Weibull distribution

Abstract

In this article, an attribute control chart is proposed when the lifetime of a product follows a Weibull distribution in two-stage sampling, which is based on the number of failures from a truncated life test. The coefficients of the proposed double sampling attribute control chart and the test duration are determined so that the average run length when the process is in control is close to the target value. An overview is reported on how double sampling np control charts work. Tables reporting the out-of-control average run lengths are given for various shift parameters. A case study is given to illustrate the proposed control chart for industrial use. A comparison of two-stage and single-stage sampling of failure of products is discussed.