Optimize design on quantum effect photo-detector array board-level packaging

Ge, Yun; Guo, Feng; Ding, Lin

doi:10.1109/ipfa.2013.6599222

Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2013

DOI: 10.1109/ipfa.2013.6599222

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Optimize design on quantum effect photo-detector array board-level packaging

Yun Ge

Feng Guo

Lin Ding

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Optimize design on quantum effect photo-detector array board-level packaging

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