2022 IEEE International Test Conference (ITC) 2022
DOI: 10.1109/itc50671.2022.00076
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Optimization of Tests for Managing Silicon Defects in Data Centers

David P. Lerner
1
,
Benson Inkley
2
,
S. Sahasrabudhe
3
et al.
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Cited by 10 publications
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Silent Data Corruptions in Computing Systems: Early Predictions and Large-Scale Measurements

Gizopoulos,
Papadimitriou,
Chatzopoulos
et al. 2024
2024 IEEE European Test Symposium (ETS)
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Silent Data Corruptions in Computing Systems: Early Predictions and Large-Scale Measurements

Gizopoulos,
Papadimitriou,
Chatzopoulos
et al. 2024
2024 IEEE European Test Symposium (ETS)
0
0
0
0
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Silent Data Corruption: Test or Reliability Problem?

Marinissen,
Dattatraya Dixit,
Blanton
et al. 2024
2024 IEEE European Test Symposium (ETS)
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Silent Data Corruptions: The Stealthy Saboteurs of Digital Integrity

Papadimitriou,
Gizopoulos,
Dixit
et al. 2023
2023 IEEE 29th International Symposium on on-Line Testing and Robust System Design (IOLTS)
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