“…Only a limited number of methods have been proposed for determining crystal quality prior to diffraction, including analysis of the birefringent properties of protein crystals and low-intensity X-ray diffraction prior to synchrotron X-ray diffraction (Watanabe, 2005;Owen & Garman, 2005). The lack of a reliable bench-top method for rapidly predicting crystal quality adds considerable time and expense to structure-determination efforts, since poorly diffracting low-quality crystals are often only identified as such after crystal harvesting and diffraction analysis by synchrotronradiation X-ray diffraction (Lunde et al, 2005;Vernede et al, 2006;Groves et al, 2007;Garcia-Caballero et al, 2011). During crystal growth, multiple crystals can grow together in nonspecific orientations and can complicate diffraction analysis, often resulting in poor quality of the structural data (Dauter, 2003;Borshchevskiy et al, 2010;Boudjemline et al, 2008;Garcia-Caballero et al, 2011;Yeates & Fam, 1999).…”