2021
DOI: 10.1016/j.yjsbx.2021.100046
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Optimization of negative stage bias potential for faster imaging in large-scale electron microscopy

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Cited by 7 publications
(7 citation statements)
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“…Bouwer et al ( Bouwer et al, 2017 ) proposed applying a negative bias voltage to the sample to decrease the interaction volume for a given acceleration voltage and improve sectioning capabilities in block-face SEM, where the block face is imaged. More recently, Vos et al (2021) and Lane et al (2021) extended this approach to BSE-imaging of sections in a SEM. Although very useful, this condition is not available to many SEM-users.…”
Section: Discussionmentioning
confidence: 99%
“…Bouwer et al ( Bouwer et al, 2017 ) proposed applying a negative bias voltage to the sample to decrease the interaction volume for a given acceleration voltage and improve sectioning capabilities in block-face SEM, where the block face is imaged. More recently, Vos et al (2021) and Lane et al (2021) extended this approach to BSE-imaging of sections in a SEM. Although very useful, this condition is not available to many SEM-users.…”
Section: Discussionmentioning
confidence: 99%
“…Both low and high magnification imaging are performed at 2.5 keV primary beam energy with a −1 kV bias potential applied to the sample stage such that the landing energy is 1.5 keV, which proved optimal for ∼100 nm sections. The negative potential bias enhances the backscattered electron (BSE) signal, which is collected by the insertable concentric backscattered detector (Thermo Fisher Scientific) ( Lane et al, 2021 ).…”
Section: Methodsmentioning
confidence: 99%
“…First, to prevent damaging or quenching of the fluorescence signal via electron-beam irradiation, each FM field of view must be acquired prior to EM exposure. Second, to compensate for the reduced application of contrast agents, backscattered electron (BSE) collection efficiency is enhanced via a negative stage bias, allowing for higher throughput ( Bouwer et al, 2016 ; Lane et al, 2021 ). Finally, a high precision EM-FM overlay is facilitated by the use of cathodoluminescent (CL) points, which eliminates the need for artificial fiducial markers ( Haring et al, 2017 ).…”
Section: Introductionmentioning
confidence: 99%
“…The final but very important component of the image acquisition system is software that allows automatic imaging of large sample areas. Research has demonstrated that the signal-to-noise ratio can be significantly improved by applying a negative bias voltage to the sample (beam deceleration) with a simultaneous increase in the acceleration voltage [ 54 , 55 , 56 , 57 ]. The increase in the recorded signal occurs owing to the re-acceleration of BSE in the bias field toward the detector.…”
Section: Multiscale Imaging Of Large Sample Areasmentioning
confidence: 99%