Optimization of low voltage metallized film capacitor geometry

Abstract

Thermal constraint is one of the major cause of capacitor failures. In this paper, a loss model, based on electrode current distribution, is first established to determine, by numerical simulation, a temperature mapping of capacitor. This mapping is successfully compared to measurements. Then a shape optimization, coupling losses computing and finite-element method, is led in order to find parameters that give the best lifespan and the larger reactive power provided. Very interesting new geometries have been found out; they allow an increase in reactive power greater than the increase in volume.

Stable dielectric response of low-loss aromatic polythiourea thin films on Pt/SiO2 substrate

“…Additionally, both systems, PP and HDPE are at present widely used in the production of foil capacitors. 9 In comparison, the " 0 values of ArPTU are almost twice higher than in HDPE and PP over entire measured temperature range and at all measuring frequencies. The difference undoubtedly results from much higher values of the dipole 6 This result suggests ArPTU as an extremely promising candidate for future use in a variety of applications, particularly film capacitors.…”