Optimization of crystallization energy density for excimer laser annealed polycrystalline silicon thin film transistors

Qi, Dongyu; Zhang, Dongli; Wang, Mingxiang; Li, Jianwen

doi:10.1109/icsict.2016.7998677

2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) 2016

DOI: 10.1109/icsict.2016.7998677

|View full text |Cite

Optimization of crystallization energy density for excimer laser annealed polycrystalline silicon thin film transistors

Dongyu Qi

Dongli Zhang

Mingxiang Wang

et al.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2024

Publication Types

Select...

Article1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

References 6 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

Roles of Trap States in the Dynamic Degradation of Polycrystalline Silicon Thin-Film Transistors Under AC Gate Bias Stress

Zhang,

Wang

et al. 2024

IEEE Trans. Electron Devices

View full text Add to dashboard Cite

Roles of Trap States in the Dynamic Degradation of Polycrystalline Silicon Thin-Film Transistors Under AC Gate Bias Stress

Zhang,

Wang

et al. 2024

IEEE Trans. Electron Devices

View full text Add to dashboard Cite

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

hi@scite.ai

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Optimization of crystallization energy density for excimer laser annealed polycrystalline silicon thin film transistors

Cited by 1 publication

References 6 publications

Roles of Trap States in the Dynamic Degradation of Polycrystalline Silicon Thin-Film Transistors Under AC Gate Bias Stress

Roles of Trap States in the Dynamic Degradation of Polycrystalline Silicon Thin-Film Transistors Under AC Gate Bias Stress

Contact Info

Product

Resources

About