Optimization of control gate material and structure for enhancing 20nm 64Gb NAND flash reliability

Kim, Hae Soo; Lee, Kang Jae; Han, Kwang Hee; Cho, Seok Won; Choi, Se Kyoung; Seo, Shin Won; Chung, Jae Hyun; Lee, Keun Woo; Chung, Sung Jae; Noh, Keum Hwan; Youn, Tae Un; Lee, Ju Yeab; Lee, Jun Young; Han, Byeong Il; Yi, Su Min; Lee, Ho Seok; Kim, Sung Soon; Shin, Wan Sup; Yun, Kwang Hyun; Ko, Min Sung; Choi, Jin Kwan; Lee, Sang Wan; Kim, Sang Deok; Ahn, Myung Kyu; Kim, Ki Seog; Jeon, Young Ho; Park, Sung Kye; Aritome, S.; Kim, Jinwoong; Lee, Sang Sun; Lee, Seok Kiu; Ahn, K. O.; Bae, Gi Hyun; Park, Sung Wook

doi:10.1109/vlsi-tsa.2012.6210120

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Optimization of control gate material and structure for enhancing 20nm 64Gb NAND flash reliability

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Investigation of Floating Gate Implantation Effect on 1Xnm NAND FLASH

Investigation of Floating Gate Implantation Effect on 1Xnm NAND FLASH

Financing for Regional Economic Integration for Northeast Asia II

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