Optimization of board-level thermomechanical reliability of high performance flip-chip package assembly

Wang, Tong Hong; Wang, Ching-Chun; Lai, Yi‐Shao; Chang, Kuo-Chin; Lee, Chien-Hsun

doi:10.1016/j.mee.2007.12.022

Cited by 12 publications

(1 citation statement)

References 12 publications

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“…A 3D slice FE model has been widely employed in many researches to study the solder joint fatigue performance of FC packages for computational efficiency (Chong et al, 2003;Zhai et al, 2004;Wang et al, 2008). The 3D slice FE model, with its employed boundary conditions, is shown in Figure 2(b).…”

Section: Convergence Analysis Of Sub-modeling and Validation Of Expermentioning

confidence: 99%

Lead‐free solder joint reliability estimation of flip chip package using FEM‐based sensitivity analysis

Lee

Chang

Yang

2009

Soldering &Amp; Surface Mount Technology

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Purpose -Integration of Cu/low-k interconnects into the next-generation integrated circuit chips, particularly for devices below the 90 nm technology node, has proved necessary to meet the urgent requirements of reducing RC time delay and low power consumption. Accordingly, establishment of feasible and robust packaging technology solutions in relation to the structural design, as well as material selection of the packaging components, has become increasingly important. Moreover, the nature of low-k materials and the use of lead-free solder greatly increases the complications in terms of ensuring enhanced packaging level reliability. The foregoing urgent issue needs to be quickly resolved while developing various advanced packages. This paper aims to focus on the issues. Design/methodology/approach -The prediction model, especially for the fatigue life of lead-free solder joints, combined with virtual design of experiment with factorial analysis was used to obtain the sensitivity information of selecting geometry/material parameters in the proposed low-k flipchip (FC) package. Moreover, a three-dimensional non-linear strip finite element model associated with the two levels of specified boundary condition of global-local technique was adopted to shorten the time of numerical calculation, as well as to give a highly accurate solution. Findings -The results of thermal cycling in experimental testing show good agreement with the simulated analysis. In addition, the sensitivity of analysis indicates that the type of underfill material has a significant effect on the lead-free solder joint reliability. Originality/value -A suitable combination of concerned designed factors is suggested in this research to enhance the reliability of low-k FC packaging with Pb-free solder joints.

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Section: Convergence Analysis Of Sub-modeling and Validation Of Expermentioning

confidence: 99%

Lead‐free solder joint reliability estimation of flip chip package using FEM‐based sensitivity analysis

Lee

Chang

Yang

2009

Soldering &Amp; Surface Mount Technology

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Effect of pre-soldering temperatures on the microstructures and shear behaviors of SnBi-SAC/ENIG solder joints

Lv,

Liu,

Xue

et al. 2024

J Mater Sci: Mater Electron

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Effect of Solder-Joint Geometry on the Low-Cycle Fatigue Behavior of Sn-xAg-0.7Cu

Lee

Huang

2016

Journal of Elec Materi

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Optimization of board-level thermomechanical reliability of high performance flip-chip package assembly

Cited by 12 publications

References 12 publications

Lead‐free solder joint reliability estimation of flip chip package using FEM‐based sensitivity analysis

Lead‐free solder joint reliability estimation of flip chip package using FEM‐based sensitivity analysis

Effect of pre-soldering temperatures on the microstructures and shear behaviors of SnBi-SAC/ENIG solder joints

Effect of Solder-Joint Geometry on the Low-Cycle Fatigue Behavior of Sn-xAg-0.7Cu

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