2001
DOI: 10.1002/pip.398
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Optimization and characterization of amorphous/crystalline silicon heterojunction solar cells

Abstract: Amorphous hydrogenated silicon/crystalline silicon (a‐Si:H/c‐Si) heterojunction solar cells are investigated and optimized with regard to efficiency and simplicity of processing. Starting with a survey of a‐Si:H/c‐Si heterojunction solar cell results from the literature, we describe the fabrication steps of our a‐Si:H/c‐Si technology and analyze the electronic device properties by quantum efficiency, current–voltage, admittance, and capacitance–voltage measurements. The open‐circuit voltage and the fill factor… Show more

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Cited by 145 publications
(66 citation statements)
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“…24 Prolonged hydrogen plasma treatment also reduces lifetime, especially for thin a-Si:H layers. Consistent with many other reports, [20][21][22][23] we find that at least 5 nm of a-Si:H is necessary for millisecond lifetimes; otherwise, the a-Si:H layers after hydrogen etching are too thin to prevent tunneling to the defective surface 25 and the underlying c-Si substrate can be damaged by the hydrogen plasma. 3,19 For device applications, a 30-s hydrogen plasma treatment on an 8-nm-thick a-Si:H layer appears to be a good recipe because the implied V oc and implied voltage at maximum power point (V mpp ) are enhanced by 35 mV and 50 mV, respectively, compared to the annealed state.…”
supporting
confidence: 78%
See 1 more Smart Citation
“…24 Prolonged hydrogen plasma treatment also reduces lifetime, especially for thin a-Si:H layers. Consistent with many other reports, [20][21][22][23] we find that at least 5 nm of a-Si:H is necessary for millisecond lifetimes; otherwise, the a-Si:H layers after hydrogen etching are too thin to prevent tunneling to the defective surface 25 and the underlying c-Si substrate can be damaged by the hydrogen plasma. 3,19 For device applications, a 30-s hydrogen plasma treatment on an 8-nm-thick a-Si:H layer appears to be a good recipe because the implied V oc and implied voltage at maximum power point (V mpp ) are enhanced by 35 mV and 50 mV, respectively, compared to the annealed state.…”
supporting
confidence: 78%
“…18 However, hydrogen plasma treatment also etches the film, 12,19 with a 2 nm/min rate in this case ( Figure 1). As intrinsic a-Si:H layers that are thinner than approximately 5 nm poorly passivate c-Si surfaces, [20][21][22][23] prolonged hydrogen plasma treatment on a-Si:H layers should be avoided during SHJ cell processing. Figure 2 investigates the minority-carrier effective lifetime in textured wafers passivated with symmetric intrinsic a-Si:H layers as they undergo the dehydrogenation and rehydrogenation observed in Figure 1.…”
mentioning
confidence: 99%
“…A minimum tolerable thickness is set, however, by the V oc , which drops rapidly for i-layers thinner than 4 nm, triggering a small drop in FF as well. Others have observed this trend previously [10]- [12]. Consistent with the defect pool model [23], De Wolf and Kondo found that the defect formation energy in an a-Si:H i-layer is lowered when a p-layer is deposited on it, since the Fermi energy E F in the i-layer is pulled away from mid gap [24].…”
Section: Losses In the I-layermentioning
confidence: 52%
“…The data point with no buffer layer and p-type emitter represents the J sc loss associated solely with parasitic absorption in the TCO film (compared to a SiN x film). Overall cell efficiency is maximized for layers that are thick enough to passivate and collect carriers, but no thicker [36,101,102].…”
Section: Absorption In A-si:h Filmsmentioning
confidence: 99%