Optimised Breast Tomosynthesis with a Novel CMOS Flat Panel Detector

Naday, Steve; Bullard, Edward; Gunn, Spencer; Brodrick, James E.; O'Tuairisg, Eoin O.; McArthur, Alan; Amin, Hamdan; Williams, Mark B.; Judy, Patricia G.; Konstantinidis, Anastasios

doi:10.1007/978-3-642-13666-5_58

Cited by 8 publications

(7 citation statements)

References 11 publications

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“…Figure 8 shows the calculated CNR of microcalcifications with diameters of 165, 230, and 400 µm at various MGDs using Eqs. (19), (20), and (22)-(24). The selected microcalcification sizes correspond to a commercial BR3D phantom (CIRS, USA) with a thickness of 5 cm and a glandular fraction of 50%.…”

Section: B Cnr Of Microcalcificationsmentioning

confidence: 99%

“…18,19 More specifically, the image quality metrics such as modulation transfer function (MTF), noise power spectrum (NPS), and detective quantum efficiency (DQE) of a 29 × 23 cm 2 large area CMOS APS x-ray imager [Dexela 2923 MAM (PerkinElmer, London)] with a ∼75 µm pixel pitch have been measured by various groups for both digital mammography and DBT. [18][19][20][21] The pixel size is capable of achieving a high Nyquist frequency ( f Nyq ) of ∼6.7 lp/mm for improved image quality. DQE of greater than 0.6 was achieved under DBT exposure conditions.…”

Section: Introductionmentioning

confidence: 99%

“…DQE of greater than 0.6 was achieved under DBT exposure conditions. 18 Naday et al 20 and Park et al 22 also investigated the reconstructed image quality using the Dexela x-ray imager. It has been shown that microcalcifications with size of 165 µm are distinguishable using CMOS APS technology.…”

Section: Introductionmentioning

confidence: 99%

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Large area CMOS active pixel sensor x‐ray imager for digital breast tomosynthesis: Analysis, modeling, and characterization

et al. 2015

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Section: B Cnr Of Microcalcificationsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Large area CMOS active pixel sensor x‐ray imager for digital breast tomosynthesis: Analysis, modeling, and characterization

et al. 2015

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“…Specifically, the 2D projection image quality of a CMOS APS x-ray imager with a 75 μm pixel pitch (Dexela 2923 MAM) has been intensively evaluated for breast imaging applications such as mammography and digital breast tomosynthesis (DBT) (Choi et al 2012, Konstantinidis et al 2012a, Patel et al 2012, Zhao et al 2015. Naday et al (2010) and Park et al (2014) also evaluated the DBT reconstructed images. As early indicators of breast cancer, detection of microcalcifications in sizes below 200 μm is critical but challenging for radiologists (Wheeler et al 2006).…”

Section: Introductionmentioning

confidence: 99%

50μm pixel pitch wafer-scale CMOS active pixel sensor x-ray detector for digital breast tomosynthesis

et al. 2015

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Wafer-scale CMOS active pixel sensors (APSs) have been developed recently for x-ray imaging applications. The small pixel pitch and low noise are very promising properties for medical imaging applications such as digital breast tomosynthesis (DBT). In this work, we evaluated experimentally and through modeling the imaging properties of a 50 μm pixel pitch CMOS APS x-ray detector named DynAMITe (Dynamic Range Adjustable for Medical Imaging Technology). A modified cascaded system model was developed for CMOS APS x-ray detectors by taking into account the device nonlinear signal and noise properties. The imaging properties such as modulation transfer function (MTF), noise power spectrum (NPS), and detective quantum efficiency (DQE) were extracted from both measurements and the nonlinear cascaded system analysis. The results show that the DynAMITe x-ray detector achieves a high spatial resolution of 10 mm(-1) and a DQE of around 0.5 at spatial frequencies <1 mm(-1). In addition, the modeling results were used to calculate the image signal-to-noise ratio (SNRi) of microcalcifications at various mean glandular dose (MGD). For an average breast (5 cm thickness, 50% glandular fraction), 165 μm microcalcifications can be distinguished at a MGD of 27% lower than the clinical value (~1.3 mGy). To detect 100 μm microcalcifications, further optimizations of the CMOS APS x-ray detector, image aquisition geometry and image reconstruction techniques should be considered.

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“…The various strategies can be divided into two categories: one is to increase the x-ray-to-image charge conversion gain so that the x-ray quantum noise can overcome the electronic noise; 6,7 and the other is to decrease the electronic noise by incorporating amplification at each pixel of the TFT array, 8,9 or using tiled CMOS amplified pixel sensors (APS). 10,11 We are investigating the first strategy by the use of an AMFPI with avalanche gain, which we call scintillator high-gain avalanche rushing photoconductor AMFPI (SHARP-AMFPI). 7 It is an indirect conversion AMFPI, where an x-ray scintillator such as structured cesium iodide (CsI) is used to convert x rays into optical photons.…”

Section: Introductionmentioning

confidence: 99%

Scintillator high‐gain avalanche rushing photoconductor active‐matrix flat panel imager: Zero‐spatial frequency x‐ray imaging properties of the solid‐state SHARP sensor structure

et al. 2012

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Purpose:The authors are investigating the feasibility of a new type of solid-state x-ray imaging sensor with programmable avalanche gain: scintillator high-gain avalanche rushing photoconductor active matrix flat panel imager (SHARP-AMFPI). The purpose of the present work is to investigate the inherent x-ray detection properties of SHARP and demonstrate its wide dynamic range through programmable gain. Methods: A distributed resistive layer (DRL) was developed to maintain stable avalanche gain operation in a solid-state HARP. The signal and noise properties of the HARP-DRL for optical photon detection were investigated as a function of avalanche gain both theoretically and experimentally, and the results were compared with HARP tube (with electron beam readout) used in previous investigations of zero spatial frequency performance of SHARP. For this new investigation, a solid-state SHARP x-ray image sensor was formed by direct optical coupling of the HARP-DRL with a structured cesium iodide (CsI) scintillator. The x-ray sensitivity of this sensor was measured as a function of avalanche gain and the results were compared with the sensitivity of HARP-DRL measured optically. The dynamic range of HARP-DRL with variable avalanche gain was investigated for the entire exposure range encountered in radiography/fluoroscopy (R/F) applications. Results: The signal from HARP-DRL as a function of electric field showed stable avalanche gain, and the noise associated with the avalanche process agrees well with theory and previous measurements from a HARP tube. This result indicates that when coupled with CsI for x-ray detection, the additional noise associated with avalanche gain in HARP-DRL is negligible. The x-ray sensitivity measurements using the SHARP sensor produced identical avalanche gain dependence on electric field as the optical measurements with HARP-DRL. Adjusting the avalanche multiplication gain in HARP-DRL enabled a very wide dynamic range which encompassed all clinically relevant medical x-ray exposures. Conclusions: This work demonstrates that the HARP-DRL sensor enables the practical implementation of a SHARP solid-state x-ray sensor capable of quantum noise limited operation throughout the entire range of clinically relevant x-ray exposures. This is an important step toward the realization of a SHARP-AMFPI x-ray flat-panel imager.

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Optimised Breast Tomosynthesis with a Novel CMOS Flat Panel Detector

Cited by 8 publications

References 11 publications

Large area CMOS active pixel sensor x‐ray imager for digital breast tomosynthesis: Analysis, modeling, and characterization

Large area CMOS active pixel sensor x‐ray imager for digital breast tomosynthesis: Analysis, modeling, and characterization

50μm pixel pitch wafer-scale CMOS active pixel sensor x-ray detector for digital breast tomosynthesis

Scintillator high‐gain avalanche rushing photoconductor active‐matrix flat panel imager: Zero‐spatial frequency x‐ray imaging properties of the solid‐state SHARP sensor structure

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