2005
DOI: 10.1016/j.sse.2004.12.002
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Optimisation of a 4H-SiC enhancement mode power JFET for high temperature operation

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Cited by 13 publications
(10 citation statements)
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“…To eliminate the need for a high temperature gate driver and also to reduce the size of the power management circuitry, a self-starting DC-DC converter is desired [34]. Here, a self-starting DC-DC converter was designed to boost the low DC output voltage of a thermoelectric generator to a level sufficient to run a SiC sensor circuit for wireless monitoring of inhospitable environments [35][36][37]. These environments may be subject to high temperatures in the case of exhaust gas monitoring in turbine engines or oven environments, they may also be subject to radiation in the nuclear industry whether they are used in power generation or waste monitoring.…”
Section: The Need For a High Temperature Self-starting Dc-dc Convertermentioning
confidence: 99%
“…To eliminate the need for a high temperature gate driver and also to reduce the size of the power management circuitry, a self-starting DC-DC converter is desired [34]. Here, a self-starting DC-DC converter was designed to boost the low DC output voltage of a thermoelectric generator to a level sufficient to run a SiC sensor circuit for wireless monitoring of inhospitable environments [35][36][37]. These environments may be subject to high temperatures in the case of exhaust gas monitoring in turbine engines or oven environments, they may also be subject to radiation in the nuclear industry whether they are used in power generation or waste monitoring.…”
Section: The Need For a High Temperature Self-starting Dc-dc Convertermentioning
confidence: 99%
“…The parameters and models that are used to simulate the BHATNAGAR structure has a code that represents the code showed in [162]. BHATNAGAR code [48] indicates the use of 4.3 TCAD Bibliography of Simulations two mobility statements (models), namely Carrier-carrier scattering and analytic (C.T.). Having two major mobility models enabled, cannot be done within ATLAS, unless they are fully compatible.…”
Section: Of Chapter 3 (Mesh Density M6) the Dashed Lines Are Results Obtained With The Parameters And Models As Published By The Bhatnagamentioning
confidence: 99%
“…Figure 2.1 shows the variation of the 4H-SiC bandgap with temperature. The few studies of experimentally measured variations, [45], [10], [46] and of simulation models considering this variation (for example not taking a fixed value for all temperatures) [47], [48] are included. In both cases, the bandgap-temperature-variation is fitted with either the semi-empirical relationship of Varshni [49] or the Passler equation [50].…”
Section: Eg Variation With Temperaturementioning
confidence: 99%
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