Optimal Periodic Testing of Intermittent Faults In Embedded Pipelined Processor Applications

Kranitis, N.; Merentitis, Andreas; Laoutaris, N.; Θεοδώρου, Γεώργιος; Paschalis, A.; Gizopoulos, Dimitris; Halatsis, C.

doi:10.1109/date.2006.243983

Cited by 27 publications

(31 citation statements)

References 9 publications

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“…Unlike most published studies, such as [20][21][22][23][24][25], the developed mathematical model considers the specifics of the architecture and application of modern avionics systems and can be used for any law of distribution of the operating time to permanent failure and intermittent fault. The described model might be further developed in order to divide the NFF events to intermittent faults and false alarms of the BITE.…”

Section: Discussionmentioning

confidence: 99%

“…The ADCN communications network comprises 16 AFDX switches and corresponding cables. The switches perform connection of 8 IOMs, 22 CPIOMs, and 50 LRUs with AFDX interface [4,5]. To reduce the number of connections from the cockpit control panel to avionics cabin computers, the controller area network (CAN) bus is used for the A380 avionics [6].…”

Section: Introductionmentioning

confidence: 99%

“…The proposed model can only be used for the systems with continuous operation. A reliability model for determining the optimal frequency of testing intermittent faults in the built-in pipelined processor by the criterion of the minimum cost of testing was considered in [22]. The Markov model with continuous time and two states is used for probabilistic modeling of intermittent faults.…”

Section: Introductionmentioning

confidence: 99%

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Maintenance Model of Digital Avionics

Raza

2018

Aerospace

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Abstract:The cost of avionics maintenance is extremely high for modern aircraft. It can be as high as 30% of the aircraft maintenance cost. A great impact on the cost of avionics maintenance is provided by a high level of No Fault Found events (NFF). Intermittent faults are the leading cause of the NFF appearance in avionics. The NFF rate for avionics systems is between 20% and 50%. The practice of avionics operation and maintenance confirms the relevance of assessing the impact of intermittent faults on the maintenance cost and the choice of such option of the maintenance management, in which the negative impact of the intermittent faults is minimized. In this paper, a new mathematical model of digital avionics maintenance is developed. Key maintenance effectiveness indicators are selected. General mathematical expressions are obtained for the average availability, mean time between unscheduled removals (MTBUR), and expected maintenance cost of single unit and redundant avionics systems, which are subject to permanent failures and intermittent faults. The dependence of the maintenance effectiveness indicators on the rate of permanent failures and intermittent faults is investigated for the case of exponential distribution of time to failures and faults. The dependence of average availability on the number of spare units in the airline's warehouse is also analyzed. On the base of the proposed maintenance model, different options of avionics maintenance management are considered. Numerical examples illustrate how to reduce the expected maintenance cost of avionics systems.

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Section: Discussionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Maintenance Model of Digital Avionics

Raza

2018

Aerospace

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“…The production cost per sold chip 3 can be calculated by the following equation to evaluate different redundancy configurations (12) where, C core manu , C core AT E , and C core burn−in indicate the manufacturing cost, ATE cost for applying test patterns, and burn-in cost per fabricated core, respectively. Note that, test cost includes both ATE cost C core AT E and burn-in cost C core burn−in .…”

Section: Proposed Cost Modelmentioning

confidence: 99%

“…It is important to note, effective online testing techniques (e.g., [2,12,21]) are essential to identify functioning cores in manycore systems for the success of the above test cost reduction methodology. With increasingly adverse reliability threats for nanometer-scale VLSI circuits, we believe such techniques are available in future large-scale manycore systems.…”

Section: Introductionmentioning

confidence: 99%