Optimal diagnostic methods for wiring interconnects

Cheng, Wu-Tung; Lewandowski, J.; Wu, Ephrem

doi:10.1109/43.160002

Cited by 23 publications

(18 citation statements)

References 17 publications

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“…The log(n+2) approach (where 'n' is the total number of nets) detects any net fault and can be easily generated using counting technique [8] [4] [5]. In order to diagnose the net faults, the 2*log(n) counting and complement counting algorithm has been suggested [10] [3]. However different t ypes of multiple shorted nets faults can not be diagnosed, since the 2*log(n) approach generates the same output vectors for the dierent pairs of shorted nets faults.…”

Section: Introductionmentioning

confidence: 99%

A new complete diagnosis patterns for wiring interconnects

Park

1996

Proceedings of the 33rd Annual Conference on Design Automation Conference - DAC '96

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It is important to test the various kinds of interconnect faults between chips on a card/module. When boundary scan design techniques are adopted, the chip to chip interconnection test generation and application of test patterns is greatly simplied. Various test generation algorithms have been developed for interconnect faults. A new interconnect test generation algorithm is introduced. It reduces the number of test patterns by half over present techniques. It also guarantees the complete diagnosis of mutiple interconnect faults.

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Section: Introductionmentioning

confidence: 99%

A new complete diagnosis patterns for wiring interconnects

Park

1996

Proceedings of the 33rd Annual Conference on Design Automation Conference - DAC '96

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“…For our problem of finding all connection classes, Jarwala and Yau [4] provided a heuristic using lg n + n − k queries, where k is the number of components. There is also a non-adaptive version of the problem where the inputs of all queries are decided before asking the oracle any question [2,8,9]. The nonadaptive version is used in applications where the query set is built into the computer hardware and the test is performed automatically.…”

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confidence: 99%

“…Shi and Fuchs also presented a recursive version of the deterministic algorithm of Section 2, for the case of the interconnect diagnosis problem. Cheng, Lewandowski and Wu [2] studied a variation of the non-adaptive diagnosis problem where the objective is to report all vertices in components that contain more than one vertex, without having to identify the connection classes. Chen and Hwang [1] studied the problem under a different model, called group testing.…”

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Diagnosis of Wiring Networks: An Optimal Randomized Algorithm for Finding Connected Components of Unknown Graphs

Shi¹,

West²

1999

SIAM J. Comput.

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Abstract. We want to find the vertex sets of components of a graph G with a known vertex set V and unknown edge set E. We learn about G by sending an oracle a query set S ⊆ V , and the oracle tells us the vertices connected to S. The objective is to use the minimum number of queries to partition the vertex set into components. The problem is also known as interconnect diagnosis of wiring networks in VLSI. We present a deterministic algorithm using O(min{k, lg n}) queries and a randomized algorithm using expected O(min{k, lg k + lg lg n}) queries, where n is the number of vertices and k is the number of components. We also prove matching lower bounds.Key words. randomized algorithm, lower bound, fault diagnosis, graph, component, connection class.AMS subject classifications. 68Q25, 68R10, 05C85, 05C40, 94C121. Introduction. We study how to find the vertex sets of components of an unknown undirected graph G = (V, E) on a known vertex set V . Vertices u and v are connected if there is a path between them. The components of G are its maximal connected subgraphs. The connection relation is an equivalence relation on the vertex set V , and the vertex sets of the components are the equivalence classes of the connection relation, also called the connection classes. When we say "finding the components", we mean finding the connection classes. In our problem, we are given V but not E. We do not know the number of components or their sizes. The only operation we may use to obtain information about G is to query an oracle. For any query set S ⊆ V , the oracle will tell us Q(S), the set of vertices connected to vertices of S:

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“…Les réponses des interconnexions sont récupérées en parallèle par les registres SR des cellules d'entrée du deuxième wrapper et décalées en serie vers l'ATE. En mode WEXBIST, les cellules de sortie du premier wrapper forment un LFSR pour générer des vecteurs de test aléatoires conformément à l'un des algorithmes développés pour le test des interconnexions tels que : log 2 (n), 2log 2 (n+2), 2n [8], [9] et (N+1) [10]. Les vecteurs de test sont appliqués en parallèle aux interconnexions sous test et les réponses sont compressées par les registres SR des cellules d'entrée du deuxième wrapper qui fonctionnent en MISR.…”

Section: Introductionunclassified

Nouveau wrapper P1500 incorporant une structure bist pour le test des IP et des interconnexions d'un SoC

Larab

Khouas

Canadian Conference on Electrical and Computer Engineering, 2005.

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Cette article présente une nouvelle architecture pour le test de modules pré-conçus « Intellectual Properties » (IP) et leurs interconnexions au niveau de systèmes intégrés sur une seule puce « System-On-Chip » (SOC). Cette nouvelle architecture de test combine la norme IEEE P1500 et la technique du test intégré « Built-In Self-Test » (BIST) dans une même structure de test configurable. L'architecture de test proposée permet principalement de réduire la surface de silicium additionnelle et d'assurer avec ses différents modes de test une bonne qualité de test sans dégradation de performances. Pour valider notre approche, nous avons comparé les surfaces obtenues pour certains circuits benchmark encapsulés en utilisant la nouvelle structure de test avec celles obtenues en utilisant une structure de test conventionnelle. Nous avons obtenu une moyenne de 5,35% de réduction de surface, le gain en surface varie entre 9,87% et 0,84%.

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Optimal diagnostic methods for wiring interconnects

Cited by 23 publications

References 17 publications

A new complete diagnosis patterns for wiring interconnects

A new complete diagnosis patterns for wiring interconnects

Diagnosis of Wiring Networks: An Optimal Randomized Algorithm for Finding Connected Components of Unknown Graphs

Nouveau wrapper P1500 incorporant une structure bist pour le test des IP et des interconnexions d'un SoC

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