Optimal design of overall yield-based variable repetitive sampling plans for processes with multiple characteristics

Nadi, Adel Ahmadi; Gildeh, Bahram Sadeghpour; Afshari, Robab

doi:10.1016/j.apm.2019.11.037

Cited by 21 publications

(4 citation statements)

References 35 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Moreover, the MQCs may be mutually correlated in practice. The exploration of the principal component analysis recommended by Nadi et al 22 that first converts correlated variables into uncorrelated linear variables is suggested. A deeper investigation into the proposed

C_{italicpk}^{T}

‐VQSS system would be considered a valuable area for future research.…”

Section: Discussionmentioning

confidence: 99%

“…Nevertheless, in practical lot disposition, multiple quality characteristics (MQCs) of sampling items are simultaneously considered. 22 With the development of sensor technologies, cost-and time-efficiently measuring MQCs in different supply chain channels have become a reality in today's manufacturing environments. [23][24][25] Accordingly, numerous motivated researchers have applied comprehensive techniques that can extend the evaluation domain of the PCI from the single variable of a quality characteristic to an integrated variable of the MQCs.…”

Section: Introductionmentioning

confidence: 99%

“…Unfortunately, the existing PCI‐based VQSS systems only account for a single quality characteristic of the product. Nevertheless, in practical lot disposition, multiple quality characteristics (MQCs) of sampling items are simultaneously considered 22 …”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Quick‐switch inspection scheme based on the overall process capability index for modern industrial web‐based processing environment

Wang

Hsu

Shu

2022

Appl Stoch Models Bus & Ind

View full text Add to dashboard Cite

Today, in Industry 4.0 and sensor‐rich environments, web‐based processing, and cloud computing have played significant roles in the quality systems designed to ensure product quality and reliability. Among quality validation technologies, variables acceptance sampling plans are essential tools in supply chain channels, where the variables quick‐switch sampling (VQSS) system is among the efficient schemes. The VQSS system comprises normal and tightened inspections that can provide a dynamic adjusting mechanism for lot disposition. Recently, the VQSS system regulated on process capability indices (PCIs) has been developed to integrate consumers' requirements into manufacturing processes. Unfortunately, the existing PCI‐based VQSS systems only consider a single, critical quality characteristic of the product. With advanced sensor technologies, cost‐efficiently measuring multiple quality characteristics (MQCs) has become a reality in today's manufacturing environments. Therefore, in this article, we emphasize developing the VQSS system with MQCs according to the overall PCI for lot disposition. By comparing the existing sampling plans, the proposed overall PCI‐based VQSS system can reduce the required sample size significantly. The results also demonstrate that the proposed system can accommodate both normal and tightened inspections' strengths to obtain a superior lot‐discrimination power. Furthermore, we have developed web‐based architecture and tools for practitioners to execute our proposed system efficiently in the cloud. They can be used to construct automation and semi‐automation applications for the lot disposition, which is appropriate in Industry 4.0 environments. Finally, a case of ultra‐mini chip resistors is illustrated to demonstrate the applicability of our designed VQSS system.

show abstract

C_{italicpk}^{T}

‐VQSS system would be considered a valuable area for future research.…”

Section: Discussionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Quick‐switch inspection scheme based on the overall process capability index for modern industrial web‐based processing environment

Wang

Hsu

Shu

2022

Appl Stoch Models Bus & Ind

View full text Add to dashboard Cite

show abstract

“…Yen et al used the one-sided process capability indices ( C pu and C pl ) to develop the repetitive sampling plan 15 . More information about PCI-based sampling can be seen in three references 12 , 16 , 17 .…”

Section: Introductionmentioning

confidence: 99%

A variable sampling plan based on the coefficient of variation for lots resubmission

Yen,

Aslam,

Chang

et al. 2023

Sci Rep

View full text Add to dashboard Cite

This study focuses on the issue of lots resubmission in inspection processes, which often arises when the initial inspection of a lot is suspected, marked as held, or not accepted. To address this problem, a novel variables sampling plan based on the coefficient of variation is proposed. The objective is to determine the sampling plan parameters that minimize the average sample number while satisfying the two-points of operating characteristic curve. Practical considerations are taken into account by providing tabulated values for the inspection sample size and acceptance criteria of the proposed plan. These tables incorporate various combinations of quality levels, considering commonly used producer's risk and consumer's risk. Furthermore, a comparative analysis between the proposed plan and a single sampling plan is conducted to highlight the advantages of the new approach. To illustrate the practical implementation of the proposed plan, an example is presented.

show abstract

Developing an adaptive sampling system indexed by Taguchi capability with acceptance-criterion-switching mechanism

Wang

2022

Int J Adv Manuf Technol

View full text Add to dashboard Cite

Optimal design of overall yield-based variable repetitive sampling plans for processes with multiple characteristics

Cited by 21 publications

References 35 publications

Quick‐switch inspection scheme based on the overall process capability index for modern industrial web‐based processing environment

Quick‐switch inspection scheme based on the overall process capability index for modern industrial web‐based processing environment

A variable sampling plan based on the coefficient of variation for lots resubmission

Developing an adaptive sampling system indexed by Taguchi capability with acceptance-criterion-switching mechanism

Contact Info

Product

Resources

About