2020
DOI: 10.1088/1742-6596/1482/1/012018
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Optically active energy states of the exciton in quantum wells of various widths

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Cited by 2 publications
(2 citation statements)
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“…Determination of the value of the radiative broadening Ŵ R from the experiment requires exact measurement of the surface reflectance, which raises difficulties, as the sample surface is not perfect. That is why the reflectance was selected so that the radiative broadening value might coincide with the results of the microscopic calculation: Ŵ R = 37 µeV [12,13]. For the resonance Xlh the energy ω X = 1.530056 eV and the radiative broadening Ŵ R = 15 µeV, which is about 2.5 times smaller than for the Xhh.…”
Section: Experiments and Processing Of Resultsmentioning
confidence: 99%
“…Determination of the value of the radiative broadening Ŵ R from the experiment requires exact measurement of the surface reflectance, which raises difficulties, as the sample surface is not perfect. That is why the reflectance was selected so that the radiative broadening value might coincide with the results of the microscopic calculation: Ŵ R = 37 µeV [12,13]. For the resonance Xlh the energy ω X = 1.530056 eV and the radiative broadening Ŵ R = 15 µeV, which is about 2.5 times smaller than for the Xhh.…”
Section: Experiments and Processing Of Resultsmentioning
confidence: 99%
“…Определение величины радиационного уширения Ŵ R из эксперимента требует точного измерения коэффициента отражения, что вызывает трудности, поскольку поверхность образца не идеальна. Поэтому коэффициент отражения был выбран таким образом, чтобы величина радиационного уширения совпадала с результатами микроскопического расчeта: Ŵ R = 37 мкэВ[12,13]. Для резонанса Xlh энергия ω X = 1.530056 эВ и радиационное уширение Ŵ R = 15 мкэВ, что в ∼ 2.5 раза меньше, чем для Xhh.…”
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