Optical Surface Profilometry of Low Reflectance Materials – Evaluation as a Laser Processing Diagnostic

Kane, D. M.; Joyce, A.; Chater, Richard J.

doi:10.1142/9789812706843_0015

Cited by 2 publications

(3 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…A three-dimensional surface profile can only be generated from the parts of the scan that actually generate interference fringes-the top cap of the adhesive droplets in this case (see figure 3). This is also observed for surface profiles of silica microspheres [20]. However, as the 'scan' plane passes into the transparent drop (not an intended, standard mode of operation for the OSP) the superposition records an internal plane of the drop, as imaged through the drop, to that plane (see figures 4(c) and (d)).…”

Section: Resultsmentioning

confidence: 58%

“…However, the lateral resolution is similar to optical microscopy (at best a quarter wavelength, in air), and low reflectance, high radius of curvature samples bring particular challenges to the technique which do limit its applicability to quantitative measurement of surface roughness for such samples. Reference [20] introduces these issues in relation to the optical surface profilometry of silica microspheres on glass surfaces.…”

Section: Microscopy and Surface Profilingmentioning

confidence: 99%

See 1 more Smart Citation

Optical surface profiling of orb-web spider capture silks

et al. 2010

View full text Add to dashboard Cite

Much spider silk research to date has focused on its mechanical properties. However, the webs of many orb-web spiders have evolved for over 136 million years to evade visual detection by insect prey. It is therefore a photonic device in addition to being a mechanical device. Herein we use optical surface profiling of capture silks from the webs of adult female St Andrews cross spiders (Argiope keyserlingi) to successfully measure the geometry of adhesive silk droplets and to show a bowing in the aqueous layer on the spider capture silk between adhesive droplets. Optical surface profiling shows geometric features of the capture silk that have not been previously measured and contributes to understanding the links between the physical form and biological function. The research also demonstrates non-standard use of an optical surface profiler to measure the maximum width of a transparent micro-sized droplet (microlens).

show abstract

Section: Resultsmentioning

confidence: 58%

Section: Microscopy and Surface Profilingmentioning

confidence: 99%

Optical surface profiling of orb-web spider capture silks

et al. 2010

View full text Add to dashboard Cite

show abstract

“…In particular, the optical absorption of the silica microspheres appears to be higher than expected. The surface imperfections and roughness of the microspheres can be examined by electron microscopy and the surface roughness of the top ‘caplets’ of the microspheres can be measured by optical surface profilometry (Kane et al , 2006). It is now necessary to develop techniques to study and measure the internal homogeneity of the glass microspheres.…”

Section: Introductionmentioning

confidence: 99%

Evaluation of imperfections in silica and chalcogenide glass microspheres using focussed ion beam milling and imaging

Kane

Chater

McPhail

2012

Journal of Microscopy

View full text Add to dashboard Cite

Key words: Focussed ion beam sectioning, glass microspheres, glass homogeneity, secondary ion imaging, secondary electron imaging. SummaryMicrospheres made from optical glasses such as silica and chalcogenide are used as both passive and active optical elements in micro-optics systems and devices. The homogeneity of the microspheres is crucial to their optical quality and performance in such devices and so it is essential, in optimizing such systems, that techniques with nanometer scale resolution are developed to measure the internal structure and homogeneity of such spheres. In this work an analytical protocol based on focussed ion beam milling, combined with secondary ion and secondary electron imaging, has been developed to study the internal homogeneity of glass microspheres. The results have shown that silica microspheres with diameters of three to five microns, fabricated by a sol-gel method, have internal inhomogeneities and voids that will lead to non-uniform optical properties. The FIB milling and imaging technique developed has been found to be a very useful method of studying such inhomogeneities, which have been proposed, but never previously observed, in glass microspheres. The FIB based technique has also been used on larger chalcogenide glass (Ga 2 S 3 :La 2 S 3 ) microspheres (diameter of order 70 microns) but no inhomogeneities have been observed at the spatial resolution of a few microns so far achieved for these larger microspheres. This study suggests that the FIB based milling and imaging technique may have potential for quantitative use in the measurement of morphological variations in such systems as well as in the study of aging processes in micron-sized glass spheres.

show abstract

Optical Surface Profilometry of Low Reflectance Materials – Evaluation as a Laser Processing Diagnostic

Cited by 2 publications

References 0 publications

Optical surface profiling of orb-web spider capture silks

Optical surface profiling of orb-web spider capture silks

Evaluation of imperfections in silica and chalcogenide glass microspheres using focussed ion beam milling and imaging

Contact Info

Product

Resources

About