2002
DOI: 10.1103/revmodphys.74.1
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Optical simulations of electron diffraction by carbon nanotubes

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Cited by 35 publications
(13 citation statements)
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“…A similar high sensitivity of layer lines on sample angular orientation has been observed in the electron diffraction pattern of achiral carbon nanotubes [18,19].…”
Section: Accidental Layer Line Extinctionssupporting
confidence: 73%
See 1 more Smart Citation
“…A similar high sensitivity of layer lines on sample angular orientation has been observed in the electron diffraction pattern of achiral carbon nanotubes [18,19].…”
Section: Accidental Layer Line Extinctionssupporting
confidence: 73%
“…pattern of carbon nanotubes [18,19] when they are described as being built up from an increasing number of carbon helices [20].…”
Section: Systematic Layer Line Extinctions: E I ؉ 1 ‫؍‬mentioning
confidence: 99%
“…Thus, the obtained results can lead to a new method of characterization of achiral carbon nanotubes, based on the rainbow effect. This method would be complementary to the existing method of characterization of nanotubes by electrons impinging on them transversely rather than longitudinally, which is based on the diffraction effect (see, e.g., Lucas et al (2002)).…”
Section: Rainbows With a Straight Very Short Bundle Of Nanotubesmentioning
confidence: 99%
“…It is known that SWNT possesses crystalline graphitic sp 2 network. [43][44] Therefore, the TEM analysis reveals that a structural transformation takes place during the vacuum breakdown that converts the crystalline structure to amorphous material.…”
Section: Resultsmentioning
confidence: 99%