Optical Scatterings in Layered Systems

Abstract

Optical properties, reflectance, absorbance and transmittance spectra, are fully investigated for the layered structures through the development of theoretical framework. The transverse dielectric function, which characterizes the dynamic charge screenings, can cover all the intralayer and interlayer atomic interactions under the electro-magnetic wave perturbation. By the continuous reflection and transmission scatterings at two surfaces, their analytic formulas are established from the vertical valence-state transitions and the boundary conditions. They are also suitable for finite-width bulk materials. Most important, this study is fully combined with the generalized tight-binding model with all the intrinsic interactions and external field.