2006
DOI: 10.1063/1.2234558
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Optical reflectivity as a simple diagnostic method for testing structural quality of icosahedral quasicrystals

Abstract: The optical reflectivity of Al-based and Ti-based quasicrystalline and approximant samples were investigated versus the quality of their structural morphology using optical reflectometry, X-ray diffraction and transmission electron microscopy. The different structural morphologies were obtained using three different preparation processes : sintering, pulsed laser deposition and reactive cathodic magnetron sputtering. The work demonstrates that the canonical behaviour of icosahedral state in specular reflectivi… Show more

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Cited by 2 publications
(3 citation statements)
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“…As was shown in [7], the films in the initial state actually turned out to be X-ray amorphous, which was also observed in [5,6]. According to scanning electron microscopy, the image of the surface of the initially deposited film (Fig.…”
Section: Resultssupporting
confidence: 63%
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“…As was shown in [7], the films in the initial state actually turned out to be X-ray amorphous, which was also observed in [5,6]. According to scanning electron microscopy, the image of the surface of the initially deposited film (Fig.…”
Section: Resultssupporting
confidence: 63%
“…In addition, the film-target saturated with tritium can be used as an important device of the neutron source generator based on the D-T reaction [5]. There are few works devoted to the formation of quasicrystalline coatings of the Ti-Zr-Ni system [5][6][7], in contrast to the Al-Cu-Fe system [8]. When deposited on a "cold" substrate, as a rule, the coating is always amorphous, and when deposited on a substrate heated to 500-700 C, it is difficult to maintain the required composition [5,6].…”
Section: Introductionmentioning
confidence: 99%
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