2003
DOI: 10.1016/s0254-0584(02)00336-x
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Optical properties of thermally evaporated cadmium telluride thin films

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Cited by 65 publications
(20 citation statements)
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“…On the other hand our diffractogram is different from that obtained by Khairnar et al [27] for CdTe thin films prepared by thermal evaporation on glass substrates at a deposition temperature of 373 K. Their [27] diffractogram showed that all of CdTe films are of single phase of hexagonal structure with H(100) as the preferential orientation. The reason of this difference between our films and their films is most probably that there films were prepared at a higher deposition temperature, and their films are of lower thickness (100-300 nm).…”
Section: Structural Propertiescontrasting
confidence: 99%
“…On the other hand our diffractogram is different from that obtained by Khairnar et al [27] for CdTe thin films prepared by thermal evaporation on glass substrates at a deposition temperature of 373 K. Their [27] diffractogram showed that all of CdTe films are of single phase of hexagonal structure with H(100) as the preferential orientation. The reason of this difference between our films and their films is most probably that there films were prepared at a higher deposition temperature, and their films are of lower thickness (100-300 nm).…”
Section: Structural Propertiescontrasting
confidence: 99%
“…[16][17][18][19][20][21][22][23][24][25]. Thermal vacuum evaporation is chosen to fabricate CdTe thin films in this work because it has advantages such as most productive, very high deposition rate, low material consumption and low cost of operation.…”
Section: Introductionmentioning
confidence: 99%
“…For fabrication of the CdTe films a variety of preparation techniques have been employed such as vacuum deposition [14][15][16], electro deposition [17], molecular beam epitaxy [18], metal-organic chemical vapor deposition [19], closed-space sublimation [20], and screen-printing [21]. The vacuum evaporation method has some advantages such as: the amount of impurities included in the growing layer will be minimized, the tendency to form oxides will be considerably reduced and finally straight line propagation will occur from the source to substrate.…”
Section: Introductionmentioning
confidence: 99%