Optical properties of porous silicon

Strashnikova, M. I.; Voznyi, Vladimir L.; Reznichenko, V. Ya.; Gaivoronskii, V. Ya.

doi:10.1134/1.1402736

Cited by 11 publications

(3 citation statements)

References 13 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The model is that or those 'mixing rule' allowing calculation of the effective permittivity of a nanocomposite on a basis of permittivities, form, and volume fraction of its constituents. Experimentally, measurement of the effective refractive index is usually carried out by means of analysis of the reflection/transmission spectra of the por-Si films [5][6][7][8][9] or by ellipsometry. [10][11][12] The detailed studies 5 13 demonstrated that the Bruggeman model 14 gives a good description of the effective permittivity of the mesoporous silicon (mesopor-Si) although other effective-medium models such as Maxwell-Garnett and Landau-Lifshits-Looyenga are also employed in some cases.…”

Section: Effective Refractive Indexmentioning

confidence: 99%

Nonlinear-Optical Properties of Porous Silicon Nanostructures

Golovan¹,

Timoshenko²

2013

Journal of Nanoelectronics and Optoelectronics

View full text Add to dashboard Cite

In the present review, we consider in detail nonlinear-optical properties of porous silicon. The nonlinear-optical properties of porous silicon are discussed in close connection with its linear optical properties. Such coherent nonlinear-optical processes as the second-and third harmonic generation are considered, with special interest to the variations of the nonlinear susceptibility tensor, phase matching in the birefringent porous silicon, and effect of the photonic crystals. Incoherent nonlinear-optical processes as nonlinear refraction, optical bleaching, and two-photon absorption are also reviewed, the different mechanisms responsible for them are discussed.

show abstract

Section: Effective Refractive Indexmentioning

confidence: 99%

Nonlinear-Optical Properties of Porous Silicon Nanostructures

Golovan¹,

Timoshenko²

2013

Journal of Nanoelectronics and Optoelectronics

View full text Add to dashboard Cite

show abstract

“…The oxidation of the PS resulted in overall reduction of the refractive index and increase of “refractometric” porosity value. More precise and reliable multi-component analysis of the PS functionalization [12] should include dispersion of the polarizabilities of the grafted layer.…”

Section: Resultsmentioning

confidence: 99%

Impact of Water Adsorption on Nonlinear Optical Properties of Functionalized Porous Silicon

et al. 2017

View full text Add to dashboard Cite

The porous silicon (PS) surface modification diagnostics due to functionalization and water adsorption/desorption processes were provided by the self-action effects of picosecond range pulsed laser radiation at 1064 nm. It was shown that the PS surface functionalization—oxide removal, alkylation, and oxidation—resulted in a refractive nonlinear optical (NLO) response sign turn to self-focusing (Δn>0) versus the self-defocusing (Δn<0) observed in the aged PS. The sensitivity of the proposed technique was revealed to water adsorption/desorption from the chemically oxidized PS interface. For the dried PS, the self-defocusing effect with corresponding NLO cubic susceptibility Re(χ (3))∼−4.7·10−9 esu was observed versus the self-focusing one (∼5·10−8 esu) for the PS positioned in saturated water vapor at room temperature. The obtained results demonstrate high sensitivity and wide versatility of the proposed readout technique based on pulsed laser radiation self-action at 1064 nm to the PS surface modification monitoring/diagnostics applications.

show abstract

“…As an effective-medium model we chose the Bruggeman model, [7][8][9] containing two groups of ellipsoidal nanoclusters of silicon, with sizes 5-30 nm and 70-100 nm, in a silicon dioxide matrix. The transmission spectrum of the …”

Section: Resultsmentioning

confidence: 99%

Selective absorption in thermally oxidized nanoporous silicon

2012

View full text Add to dashboard Cite

This paper presents a study of the optical properties of thermally oxidized nanoporous silicon in the wavenumber range 5000-400 cm −1 . It is shown for the first time that thermally oxidized nanoporous silicon has two broad regions of reduced transmittance in the wavenumber range from 3720 to 3000 cm −1 and five narrow zones that have their minima at the following wave numbers: 2920, 2240, 1680, 840, and 600 cm −1 . The transmittance spectra of the thermally oxidized SiO 2 -Si structure are measured in the wavenumber range 5000-400 cm −1 . It is established that the thermally oxidized SiO 2 -Si structure is transparent in the wavenumber range 5000-1200 cm −1 and has narrow absorption peaks insignificant in magnitude at 1090 cm −1 and 620 cm −1 . It is shown that thermally oxidized nanoporous silicon can be used as a selectively absorbing and recording medium in the IR range.

show abstract

Optical properties of porous silicon

Cited by 11 publications

References 13 publications

Nonlinear-Optical Properties of Porous Silicon Nanostructures

Nonlinear-Optical Properties of Porous Silicon Nanostructures

Impact of Water Adsorption on Nonlinear Optical Properties of Functionalized Porous Silicon

Selective absorption in thermally oxidized nanoporous silicon

Contact Info

Product

Resources

About