The complex dielectric function of slightly differently prepared polycrystalline A1 films is determined ellipsometrically for photon energies hw between 1 and 4 eV. The results can be explained by symmetrical and asymmetrical EMA for hw 2 1.8 eV through the incorporation of A1,0,. Below 1.8 eV significant discrepances occur due to resonantly enhanced electric fields in nonspherical A1 grains surrounded by a dielectric.