Optical properties of hydrated tungsten trioxide 3WO3·H2O

Valyukh, Iryna; Jiao, Zhenjun; Arwin, Hans; Sun, Xiao Wei

doi:10.1016/j.tsf.2014.04.049

Cited by 7 publications

(2 citation statements)

References 13 publications

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“…The band gap of the films after annealing was determined from UPS to be 3.64 ± 0.3 eV (SI, Figures S14–S17). This value is in good agreement with previous literature, − although somewhat higher than that reported for crystalline WO 3 films . Due to low surface coverage of the nanowires, a Hall effect measurement could not be obtained.…”

Section: Resultssupporting

confidence: 93%

Volatile Hexavalent Oxo-amidinate Complexes: Molybdenum and Tungsten Precursors for Atomic Layer Deposition

Mouat¹,

Mane

Elam

et al. 2016

Chem. Mater.

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New complexes MoO2(tBuAMD)2 (1) and WO2(tBuAMD)2 (2) (AMD = acetamidinato) are synthesized and fully characterized as precursors for atomic layer deposition (ALD). They contain metal-oxo functionalities not previously utilized in ALD-type growth processes and are fully characterized by 1H and 13C NMR, X-ray diffraction (XRD), Fourier transform infrared, thermogravimetric analysis, single-crystal XRD, and elemental analysis. Guided by quartz-crystal microbalance studies, ALD growth methodologies for both complexes have been developed. Remarkably, these isostructural compounds exhibit dramatic differences in ALD properties. Using 1 and O3, amorphous, ultrathin molybdenum oxynitride (MoON) films are grown on Si(100) wafers. Using 2 and H2O yields amorphous WO3 films on Si(100) wafers that crystallize as WO3 nanowires upon annealing. Although 1/H2O and 2/O3 growth was attempted, effective ALD growth could only be obtained with 1/O3 and 2/H2O, underscoring reactivity differences in these precursors. Film thicknesses, compositions, and optical and electrical parameters are characterized by variable angle spectroscopic ellipsometry, X-ray reflectivity, grazing incidence X-ray diffraction, X-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, and atomic force microscopy techniques. The hitherto unknown ALD chemistry of group VI metal-oxo compounds lays a foundation for their use in the ALD synthesis of heterogeneous catalysts.

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Section: Resultssupporting

confidence: 93%

Volatile Hexavalent Oxo-amidinate Complexes: Molybdenum and Tungsten Precursors for Atomic Layer Deposition

Mouat¹,

Mane

Elam

et al. 2016

Chem. Mater.

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“…2 The optical properties of highly transparent substrates are important for accurately designing optical systems and optical fiber waveguides. 3 Several typical methods have been introduced to obtain the optical constants of transparent crystals, 4 such as the combination method based on reflectance and transmittance, [5][6][7][8][9] the Kramers-Kronig transform method, [10][11][12] the photoacoustic technique method, 13,14 the attenuated total reflection method, 15 the ellipsometry method (EM), [16][17][18][19] and the transmission method. 20,21 Recently, the combination method based on the near-normal reflectance and normal transmittance measurement was regularly applied to measure the optical constants of materials with a relatively high refractive index.…”

Section: Introductionmentioning

confidence: 99%

A New Method for Determining the Optical Constants of Highly Transparent Solids

Wang

Zhao

2016

Appl Spectrosc

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Highly transparent substrates are of interest for a variety of applications, but it is difficult to measure their optical constants precisely, especially the absorption index in the transparent spectral region. In this paper, a combination technique (DOPTM-EM) using both the double optical pathlength transmission method (DOPTM) and the ellipsometry method (EM) is presented to obtain the optical constants of highly transparent substrates, which overcomes the deficiencies of both the two methods. The EM cannot give accurate result of optical constants when the absorption index is very weak. The DOPTM is suitable to retrieve the weak absorption index; however, two sets of solutions exist for the retrieved refractive index and absorption index, and only one is the true value that needs to be identified. In the DOPTM-EM, the optical constants are measured first by using the EM and set as the initial value in the gradient-based inverse method used in the DOPTM, which ensures only the true optical constants are retrieved. The new method simultaneously obtains the refractive index and the absorption index of highly transparent substrate without relying on the Kramers-Kronig relation. The optical constants of three highly transparent substrates (polycrystalline BaF, CaF, and MgF) were experimentally determined within wavelength range from ultraviolet to infrared regions (0.2-14 µm). The presented method will facilitate the measurement of optical constants for highly transparent materials.

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Aging of the nanosized photochromic WO3 films and the role of adsorbed water in the photochromism

Gavrilyuk

2016

Applied Surface Science

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Optical properties of hydrated tungsten trioxide 3WO3·H2O

Cited by 7 publications

References 13 publications

Volatile Hexavalent Oxo-amidinate Complexes: Molybdenum and Tungsten Precursors for Atomic Layer Deposition

Volatile Hexavalent Oxo-amidinate Complexes: Molybdenum and Tungsten Precursors for Atomic Layer Deposition

A New Method for Determining the Optical Constants of Highly Transparent Solids

Aging of the nanosized photochromic WO3 films and the role of adsorbed water in the photochromism

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