Optical properties of CdSxTe1−x polycrystalline thin films

Wood, David; Lane, David W.; Rogers, Keith; Coath, John A.

doi:10.1007/s11664-999-0130-y

Cited by 8 publications

(10 citation statements)

References 17 publications

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“…5 showed the change of refraction index (n) versus the wavelength of the films that have a high (n) at the range of (480-1100nm) equal to about 2.6 , the maximum value depend on the x value and shifted towards NIR with increasing Te, similar results found by D.A. Wood et al [17] , the refractive index of the films were obtained by using the equation [18]:…”

Section: Optical Propertiessupporting

confidence: 73%

Structural and Optical Properties ofCdSxTe1-xThin Films Fabricated by Thermal Evaporation.

AL-Jumaili¹,

O.Abdolhadi²

2013

JUAPS

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CdS x Te 1-x films in the range of ( x=0.9 , 0.8, 0.7 ) about 300 nm thickness have been formed on glass substrates by thermal evaporation . X-ray results showed that the CdTe film was polycrystalline with cubic zinc blend structure and had preferred growth of grains along the (111) crystallographic direction. Also, CdS was polycrystalline with hexagonal wurtzite structure and had preferred growth of grains along (002) crystallographic direction while CdS x Te 1-x films studied the phase change with an inversion point related to the x-value . Transmittance and absorbance spectra of the films were measured as a function of wavelength (300-1100) nm . Then the band gap of the films calculated by using absorption spectrum , where the direct optical energy gap for CdTe is 1.48 eV and for CdS is 2.5 eV while the direct optical gap of CdS x Te 1-x films be limited to between CdS and CdTe , and varied non-linearly , showing downward with decrease x-value .Also the refractive index (n) of these films are discussed.. .

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Section: Optical Propertiessupporting

confidence: 73%

Structural and Optical Properties ofCdSxTe1-xThin Films Fabricated by Thermal Evaporation.

AL-Jumaili¹,

O.Abdolhadi²

2013

JUAPS

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“…Hence, the extended response at lower photon energies cannot be fully explained simply in terms of the reduced band gap at low sulphur concentrations. Similarly, although the band gap of CdS reduces sharply with the introduction of tellurium into the lattice, recent work [15] has shown that the absorption coefficient of CdS 0.8 Te 0.2 was considerably smaller than that of CdS at photon energies greater than 2.1 eV. Both of these results show that knowledge of the band gap alone is not enough for modelling the performance of CdS-CdTe solar cells-an understanding of the variation of the optical constants with wavelength is required.…”

Section: Introductionmentioning

confidence: 99%

“…Previous work [15] determined the form of the variation of the refractive index (n) and extinction coefficient (k) with wavelength for 40 nm films of CdS x Te 1−x . The current work establishes the variation of n and k with wavelength for films of approximately 2 µm (the thickness of the absorber layer in typical CdS-CdTe solar cells).…”

Section: Introductionmentioning

confidence: 99%

Optical and structural characterization of CdS_xTe_1-xthin films for solar cell applications

Wood¹,

Lane

Rogers

et al. 2000

J. Phys.: Condens. Matter

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The optical constants have been determined for films of CdSxTe1-x over the wavelength range 250-3200 nm. The films were prepared by vacuum evaporation from solid solutions. Rutherford backscattering spectrometry has been employed to determine the thickness of the films, which is in the range 1390-2430 nm, and x-ray diffraction has been used to determine the phase and lattice parameters. The films were found to be cubic for x<0.65, and hexagonal for x>0.65. Reflectance and transmittance measurements have been made over the wavelength region 250-3200 nm, and a model, which includes the effects of coherent scattering, has been used to determine the complex refractive index in the transparent region. A singly subtractive Kramers-Kronig algorithm is derived for use with reflectance data of equal wavelength spacing. This novel Kramers-Kronig transform has been used to determine the optical constants in the opaque region. Polynomial functions are supplied which describe the variation of refractive index and extinction coefficient with wavelength. The photon energies required for both direct and indirect transitions have been found by least-squares fitting to the absorption spectra. The results are compared with previous work on 40 nm thick films.

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“…Thin films of polycrystalline CdS x Te 1Àx (0 x 1.0) have also been prepared by vacuum evaporation. The complex refractive indices n Ã ¼ n þ ik for these films have been determined in the wavelength range of 250-3200 nm from reflectance and transmittance measurements [315]. SE has been used to determine the optical constants in the IR-UV spectral region of polycrystalline CdS x Te 1Àx films (0 x x1.0) grown on borosilicate glasses by PLD [316].…”

Section: (B) Cdstementioning

confidence: 99%