“…Micro-Raman spectroscopy has been used as a noninvasive and versatile tool to map the mechanical strain/stress in large domain single crystalline materials on arbitrary substrates, such as MBE III–V materials, graphene, − multilayered semiconductors, metal oxides and 2D layered chalcogenides . As Raman peaks can be influenced by temperature, charge density, polarization, , and defects, it is critical to choose the phonon modes that are most sensitive to strain/stress. On the same sample, both the phonon frequency shift and the full width at half maximum (FWHM) vary less than 0.1 cm –1 .…”